loadpatents
Patent applications and USPTO patent grants for TAMURA; Takuo.The latest application filed is for "inspection system, charger/discharger, and inspection method of secondary battery".
Patent | Date |
---|---|
Inspection System, Charger/Discharger, and Inspection Method of Secondary Battery App 20130335009 - KATSUMATA; Daisuke ;   et al. | 2013-12-19 |
Automatic Analyzer And Automatic Analysis Method App 20130132022 - Tamura; Takuo ;   et al. | 2013-05-23 |
Automatic Analysis Device App 20130108509 - Shiba; Masaki ;   et al. | 2013-05-02 |
Image display device Grant 7,750,548 - Tamura , et al. July 6, 2 | 2010-07-06 |
Image Display Device App 20080129187 - Tamura; Takuo ;   et al. | 2008-06-05 |
Method for analyzing circuit pattern defects and a system thereof Grant 7,352,890 - Shimoda , et al. April 1, 2 | 2008-04-01 |
Image Display Device App 20070210697 - Tamura; Takuo ;   et al. | 2007-09-13 |
Method for manufacturing an organic electroluminescence display Grant 7,258,586 - Tamura , et al. August 21, 2 | 2007-08-21 |
Display device and method for manufacturing the same Grant 7,232,716 - Yamaguchi , et al. June 19, 2 | 2007-06-19 |
Thin film transistor and method of manufacturing the same Grant 7,227,186 - Tamura , et al. June 5, 2 | 2007-06-05 |
Image display device App 20070029924 - Ushifusa; Nobuyuki ;   et al. | 2007-02-08 |
Methods for repairing and manufacturing display device App 20060205103 - Tamura; Takuo ;   et al. | 2006-09-14 |
Thin film electron emitter, manufacturing method thereof, and image display device using the thin film electron emitter App 20060202607 - Sano; Yasushi ;   et al. | 2006-09-14 |
Method for analyzing circuit pattern defects and a system thereof App 20060140472 - Shimoda; Atsushi ;   et al. | 2006-06-29 |
Method and system for analyzing circuit pattern defects Grant 7,062,081 - Shimoda , et al. June 13, 2 | 2006-06-13 |
Method for manufacturing an organic electroluminescence display App 20050215163 - Tamura, Takuo ;   et al. | 2005-09-29 |
Thin film transistor and method of manufacturing the same App 20050202612 - Tamura, Takuo ;   et al. | 2005-09-15 |
Display device and method for manufacturing the same App 20050142701 - Yamaguchi, Hironaru ;   et al. | 2005-06-30 |
Thin film transistor and display using the same Grant 6,903,371 - Tamura , et al. June 7, 2 | 2005-06-07 |
Process for manufacturing thin film transistor on unannealed glass substrate Grant 6,861,299 - Horikoshi , et al. March 1, 2 | 2005-03-01 |
Thin-film transistor and method of manufacturing the same Grant 6,815,717 - Horikoshi , et al. November 9, 2 | 2004-11-09 |
Thin film transistor and display using the same App 20040155295 - Tamura, Takuo ;   et al. | 2004-08-12 |
Process of manufacturing a thin-film transistor Grant 6,767,760 - Horikoshi , et al. July 27, 2 | 2004-07-27 |
Irradiation of manufacturing a thin film transistor by laser irradiation Grant 6,716,688 - Tamura , et al. April 6, 2 | 2004-04-06 |
Liquid crystal display element and method of manufacturing the same Grant 6,670,638 - Tamura , et al. December 30, 2 | 2003-12-30 |
Transistor with thin film active region having clusters of different crystal orientation Grant 6,657,227 - Tamura , et al. December 2, 2 | 2003-12-02 |
Method of manufacturing thin film transistor App 20030189205 - Horikoshi, Kazuhiko ;   et al. | 2003-10-09 |
Thin film transistor and display apparatus with the same App 20030160283 - Tanaka, Jun ;   et al. | 2003-08-28 |
Thin film transistor and method of manufacturing the same App 20030094658 - Tamura, Takuo ;   et al. | 2003-05-22 |
Thin Film Transistor App 20030042484 - Horikoshi, Kazuhiko ;   et al. | 2003-03-06 |
Thin-film transistor and method of manufacturing the same App 20020153567 - Horikoshi, Kazuhiko ;   et al. | 2002-10-24 |
Thin-film transistor and method of manufacturing the same App 20020113264 - Horikoshi, Kazuhiko ;   et al. | 2002-08-22 |
Thin film transistor and method of manufacturing the same App 20020066931 - Tamura, Takuo ;   et al. | 2002-06-06 |
Liquid crystal display element and method of manufacturing the same App 20020036289 - Tamura, Takuo ;   et al. | 2002-03-28 |
Method for analyzing circuit pattern defects and a system thereof App 20010016061 - Shimoda, Atsushi ;   et al. | 2001-08-23 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.