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Patent applications and USPTO patent grants for Tamura; Muneaki.The latest application filed is for "test device, test method, and memory medium".
Patent | Date |
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Probe device and method of adjusting the same Grant 11,340,263 - Tamura May 24, 2 | 2022-05-24 |
Test device, test method, and memory medium Grant 11,221,363 - Tamura January 11, 2 | 2022-01-11 |
Test Device, Test Method, and Memory Medium App 20200241069 - TAMURA; Muneaki | 2020-07-30 |
Probe Device And Method Of Adjusting The Same App 20200174040 - TAMURA; Muneaki | 2020-06-04 |
Probe apparatus and probe method Grant 10,310,010 - Tamura , et al. | 2019-06-04 |
Position accuracy inspecting method, position accuracy inspecting apparatus, and position inspecting unit Grant 10,006,941 - Saiki , et al. June 26, 2 | 2018-06-26 |
Position Accuracy Inspecting Method, Position Accuracy Inspecting Apparatus, And Position Inspecting Unit App 20170219625 - Saiki; Kenta ;   et al. | 2017-08-03 |
Probe Apparatus And Probe Method App 20160161553 - TAMURA; Muneaki ;   et al. | 2016-06-09 |
Semiconductor Surface Inspection Apparatus and Method of Illumination App 20080024794 - Miyazaki; Yoko ;   et al. | 2008-01-31 |
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