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Tamura; Muneaki Patent Filings

Tamura; Muneaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tamura; Muneaki.The latest application filed is for "test device, test method, and memory medium".

Company Profile
3.4.5
  • Tamura; Muneaki - Nirasaki JP
  • TAMURA; Muneaki - Nirasaki City Yamanashi
  • Tamura; Muneaki - Yamanashi JP
  • Tamura; Muneaki - Nirasaki-shi Yamanashi
  • Tamura; Muneaki - Tokyo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Probe device and method of adjusting the same
Grant 11,340,263 - Tamura May 24, 2
2022-05-24
Test device, test method, and memory medium
Grant 11,221,363 - Tamura January 11, 2
2022-01-11
Test Device, Test Method, and Memory Medium
App 20200241069 - TAMURA; Muneaki
2020-07-30
Probe Device And Method Of Adjusting The Same
App 20200174040 - TAMURA; Muneaki
2020-06-04
Probe apparatus and probe method
Grant 10,310,010 - Tamura , et al.
2019-06-04
Position accuracy inspecting method, position accuracy inspecting apparatus, and position inspecting unit
Grant 10,006,941 - Saiki , et al. June 26, 2
2018-06-26
Position Accuracy Inspecting Method, Position Accuracy Inspecting Apparatus, And Position Inspecting Unit
App 20170219625 - Saiki; Kenta ;   et al.
2017-08-03
Probe Apparatus And Probe Method
App 20160161553 - TAMURA; Muneaki ;   et al.
2016-06-09
Semiconductor Surface Inspection Apparatus and Method of Illumination
App 20080024794 - Miyazaki; Yoko ;   et al.
2008-01-31

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