Tamura; Hifumi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Tamura; Hifumi.The latest application filed is for "secondary-ion mass spectrometry apparatus using field limiting method".
- Tamura; Hifumi - Hachioji JP
- Tamura; Hifumi - Hachiohji JP
- Tamura; Hifumi - Tokyo JP
| Patent | Date |
|---|---|
| Secondary-ion mass spectrometry apparatus using field limiting method Grant 5,278,407 - Ikebe , et al. January 11, 1 | 1994-01-11 |
| Composite apparatus with secondary ion mass spectrometry instrument and scanning electron microscope Grant 5,008,537 - Toita , et al. April 16, 1 | 1991-04-16 |
| Method and apparatus for neutralizing an accumulated charge on a specimen by means of a conductive lattice deposited on the specimen Grant 4,992,661 - Tamura , et al. February 12, 1 | 1991-02-12 |
| Charged particle source Grant 4,924,101 - Sakudo , et al. May 8, 1 | 1990-05-08 |
| Liquid metal ion source Grant 4,774,414 - Umemura , et al. September 27, 1 | 1988-09-27 |
| Apparatus for generating metal ions Grant 4,774,433 - Ikebe , et al. September 27, 1 | 1988-09-27 |
| Ion micro beam apparatus Grant 4,755,685 - Kawanami , et al. July 5, 1 | 1988-07-05 |
| Hybrid charged particle apparatus Grant 4,740,698 - Tamura , et al. April 26, 1 | 1988-04-26 |
| Liquid metal ion source with pulse generator control Grant 4,733,134 - Tamura , et al. March 22, 1 | 1988-03-22 |
| Ion microbeam apparatus Grant 4,710,632 - Ishitani , et al. December 1, 1 | 1987-12-01 |
| Apparatus for implanting ion microbeam Grant 4,697,086 - Ishitani , et al. September 29, 1 | 1987-09-29 |
| Ion source Grant 4,687,938 - Tamura , et al. August 18, 1 | 1987-08-18 |
| Ion beam apparatus Grant 4,687,930 - Tamura , et al. August 18, 1 | 1987-08-18 |
| Liquid metal ion source Grant 4,680,507 - Uemura , et al. July 14, 1 | 1987-07-14 |
| Ion source Grant 4,631,448 - Tamura , et al. December 23, 1 | 1986-12-23 |
| Liquid metal ion source and apparatus Grant 4,624,833 - Umemura , et al. November 25, 1 | 1986-11-25 |
| Liquid metal ion source Grant 4,567,398 - Ishitani , et al. January 28, 1 | 1986-01-28 |
| Ion source Grant 4,560,907 - Tamura , et al. December 24, 1 | 1985-12-24 |
| Ion micro-analysis Grant 4,510,387 - Izumi , et al. April 9, 1 | 1985-04-09 |
| Apparatus for irradiation with charged particle beams Grant 4,479,060 - Tamura , et al. October 23, 1 | 1984-10-23 |
| Source of charged particles beam Grant 4,438,371 - Hosoki , et al. March 20, 1 | 1984-03-20 |
| Ion-electron analyzer Grant 4,233,509 - Tamura , et al. November 11, 1 | 1980-11-11 |
| Ion microprobe analyzer Grant 4,081,674 - Tamura , et al. March 28, 1 | 1978-03-28 |
| Ion microanalyzer Grant 3,986,025 - Fujiwara , et al. October 12, 1 | 1976-10-12 |
| Ion microprobe analyser Grant 3,930,155 - Kanomata , et al. December 30, 1 | 1975-12-30 |
| Ion microanalyzer Grant 3,889,115 - Tamura , et al. June 10, 1 | 1975-06-10 |
| Ion microprobe analyzer Grant 3,881,108 - Kondo , et al. April 29, 1 | 1975-04-29 |
| Ion Microanalyzer Grant 3,845,304 - Tamura , et al. October 29, 1 | 1974-10-29 |
| Ion Microanalyzer Grant 3,840,743 - Tamura , et al. October 8, 1 | 1974-10-08 |
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