Tamori; Tomohiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for Tamori; Tomohiro.The latest application filed is for "pattern measurement device and pattern measurement method".
- Tamori; Tomohiro - Tokyo JP
| Patent | Date |
|---|---|
| Pattern Measurement Device and Pattern Measurement Method App 20220260930 - Yamamoto; Takuma ; et al. | 2022-08-18 |
| Pattern measurement device and pattern measurement method Grant 11,353,798 - Yamamoto , et al. June 7, 2 | 2022-06-07 |
| Charged Particle Beam System and Overlay Shift Amount Measurement Method App 20210055098 - YAMAKI; Takuma ; et al. | 2021-02-25 |
| Pattern measurement device and pattern measurement method Grant 10,816,332 - Ohta , et al. October 27, 2 | 2020-10-27 |
| Pattern Measurement Device and Pattern Measurement Method App 20200292308 - OHTA; Hiroya ; et al. | 2020-09-17 |
| Pattern Measurement Device and Pattern Measurement Method App 20200278615 - YAMAMOTO; Takuma ; et al. | 2020-09-03 |
| Sample observation device having a selectable acceleration voltage Grant 10,141,159 - Doi , et al. Nov | 2018-11-27 |
| Sample Observation Device App 20150371816 - DOI; Ayumi ; et al. | 2015-12-24 |
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