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Patent applications and USPTO patent grants for Tamezane; Hideto.The latest application filed is for "abnormality determining method, and automatic analyzer".
Patent | Date |
---|---|
Automatic analyzer Grant 11,169,166 - Tamezane , et al. November 9, 2 | 2021-11-09 |
Abnormality Determining Method, And Automatic Analyzer App 20210341502 - Tamezane; Hideto ;   et al. | 2021-11-04 |
Automatic analyzer Grant 11,041,874 - Chida , et al. June 22, 2 | 2021-06-22 |
Automatic Analyzer App 20200096529 - CHIDA; Saori ;   et al. | 2020-03-26 |
Automatic analyzer Grant 10,288,637 - Tamezane , et al. | 2019-05-14 |
Automatic analyzer Grant 9,897,624 - Tamezane , et al. February 20, 2 | 2018-02-20 |
Automatic Analyser App 20180031589 - TAMEZANE; Hideto ;   et al. | 2018-02-01 |
Automatic analyzer Grant 9,857,388 - Tamezane , et al. January 2, 2 | 2018-01-02 |
Automatic Analyzer App 20170089938 - TAMEZANE; Hideto ;   et al. | 2017-03-30 |
Automatic analyzer Grant 9,599,631 - Yamazaki , et al. March 21, 2 | 2017-03-21 |
Automatic analyzer and method for determining malfunction thereof Grant 9,470,570 - Nishida , et al. October 18, 2 | 2016-10-18 |
Automatic analyzer Grant 9,335,335 - Mimura , et al. May 10, 2 | 2016-05-10 |
Automatic Analyzer App 20150362514 - TAMEZANE; Hideto ;   et al. | 2015-12-17 |
Automatic Analyzer App 20150323557 - TAMEZANE; Hideto ;   et al. | 2015-11-12 |
Automatic Analyzer App 20150219680 - Mimura; Tomonori ;   et al. | 2015-08-06 |
Automatic Analyzer App 20140220693 - Yamazaki; Isao ;   et al. | 2014-08-07 |
Automatic Analyzer And Method For Determining Malfunction Thereof App 20140190253 - Nishida; Masaharu ;   et al. | 2014-07-10 |
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