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Patent applications and USPTO patent grants for Tamegaya; Yukio.The latest application filed is for "semiconductor device and semiconductor device measuring system".
Patent | Date |
---|---|
Semiconductor device and semiconductor device measuring system Grant 8,362,785 - Tamegaya January 29, 2 | 2013-01-29 |
Semiconductor Device And Semiconductor Device Measuring System App 20100271065 - TAMEGAYA; Yukio | 2010-10-28 |
Method and apparatus for measuring an overlap length of MISFET, and a recording medium and a device model each carrying an extraction program for determining the overlap length Grant 6,295,630 - Tamegaya September 25, 2 | 2001-09-25 |
Process and device composite simulation system and simulation method Grant 5,629,877 - Tamegaya May 13, 1 | 1997-05-13 |
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