Tamarapalli; Nagesh
Patent Applications and Registrations
Patent applications and USPTO patent grants for Tamarapalli; Nagesh.The latest application filed is for "enhanced diagnosis with limited failure cycles".
- Tamarapalli; Nagesh - Karnataka IN
- Tamarapalli; Nagesh - Wilsonville OR
- Tamarapalli; Nagesh - Willsonville OR
- Tamarapalli; Nagesh - Tualatin OR
| Patent | Date |
|---|---|
| Enhanced diagnosis with limited failure cycles Grant 8,595,574 - Huang , et al. November 26, 2 | 2013-11-26 |
| Enhanced Diagnosis With Limited Failure Cycles App 20130246869 - Huang; Yu ; et al. | 2013-09-19 |
| Enhanced diagnosis with limited failure cycles Grant 8,438,438 - Huang , et al. May 7, 2 | 2013-05-07 |
| Compactor independent fault diagnosis Grant 8,301,414 - Cheng , et al. October 30, 2 | 2012-10-30 |
| Fault dictionaries for integrated circuit yield and quality analysis methods and systems Grant 7,987,442 - Rajski , et al. July 26, 2 | 2011-07-26 |
| Enhanced Diagnosis With Limited Failure Cycles App 20110126064 - Huang; Yu ; et al. | 2011-05-26 |
| Enhanced diagnosis with limited failure cycles Grant 7,840,862 - Huang , et al. November 23, 2 | 2010-11-23 |
| Phase shifter with reduced linear dependency Grant 7,805,651 - Rajski , et al. September 28, 2 | 2010-09-28 |
| Phase Shifter With Reduced Linear Dependency App 20100083063 - Rajski; Janusz ; et al. | 2010-04-01 |
| Phase shifter with reduced linear dependency Grant 7,653,851 - Rajski , et al. January 26, 2 | 2010-01-26 |
| Determining And Analyzing Integrated Circuit Yield And Quality App 20090210183 - Rajski; Janusz ; et al. | 2009-08-20 |
| Phase Shifter With Reduced Linear Dependency App 20090187800 - Rajski; Janusz ; et al. | 2009-07-23 |
| Phase shifter with reduced linear dependency Grant 7,523,372 - Rajski , et al. April 21, 2 | 2009-04-21 |
| Determining and analyzing integrated circuit yield and quality Grant 7,512,508 - Rajski , et al. March 31, 2 | 2009-03-31 |
| Method and apparatus for at-speed testing of digital circuits Grant 7,437,636 - Rajski , et al. October 14, 2 | 2008-10-14 |
| Phase shifter with reduced linear dependency App 20070300110 - Rajski; Janusz ; et al. | 2007-12-27 |
| Compactor Independent Fault Diagnosis App 20070283202 - Cheng; Wu-Tung ; et al. | 2007-12-06 |
| Enhanced diagnosis with limited failure cycles App 20070220381 - Huang; Yu ; et al. | 2007-09-20 |
| Phase shifter with reduced linear dependency Grant 7,263,641 - Rajski , et al. August 28, 2 | 2007-08-28 |
| Compactor independent fault diagnosis Grant 7,239,978 - Cheng , et al. July 3, 2 | 2007-07-03 |
| Fault dictionaries for integrated circuit yield and quality analysis methods and systems App 20060066338 - Rajski; Janusz ; et al. | 2006-03-30 |
| Determining and analyzing integrated circuit yield and quality App 20060066339 - Rajski; Janusz ; et al. | 2006-03-30 |
| Method and apparatus for at-speed testing of digital circuits App 20060064616 - Rajski; Janusz ; et al. | 2006-03-23 |
| Integrated circuit yield and quality analysis methods and systems App 20060053357 - Rajski; Janusz ; et al. | 2006-03-09 |
| Method and apparatus for at-speed testing of digital circuits Grant 6,966,021 - Rajski , et al. November 15, 2 | 2005-11-15 |
| Compactor independent fault diagnosis App 20050222816 - Cheng, Wu-Tung ; et al. | 2005-10-06 |
| Uniform testing of tristate nets in logic BIST Grant 6,920,597 - Rinderknecht , et al. July 19, 2 | 2005-07-19 |
| Phase shifter with reduced linear dependency Grant 6,874,109 - Rajski , et al. March 29, 2 | 2005-03-29 |
| Phase shifter with reduced linear dependency App 20050015688 - Rajski, Janusz ; et al. | 2005-01-20 |
| Uniform testing of tristate nets in logic BIST App 20040025096 - Rinderknecht, Thomas Hans ; et al. | 2004-02-05 |
| Method and apparatus for at-speed testing of digital circuits App 20030097614 - Rajski, Janusz ; et al. | 2003-05-22 |
| At-speed test using on-chip controller App 20030084390 - Tamarapalli, Nagesh ; et al. | 2003-05-01 |
| Circuit for switching between multiple clocks Grant 6,452,426 - Tamarapalli , et al. September 17, 2 | 2002-09-17 |
| Multi-phase test point insertion for built-in self test of integrated circuits Grant 5,737,340 - Tamarapalli , et al. April 7, 1 | 1998-04-07 |
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