TAMAKI; Hirokazu

Patent Applications and Registrations

Patent applications and USPTO patent grants for TAMAKI; Hirokazu.The latest application filed is for "charged particle beam apparatus and method for controlling charged particle beam apparatus".

Company Profile

2.8.12

TAMAKI; Hirokazu - Tokyo JP
Tamaki; Hirokazu - Izumi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged Particle Beam Apparatus And Method For Controlling Charged Particle Beam Apparatus App 20220230844 - DOBASHI; Takashi ; et al.	2022-07-21
Charged Particle Beam Apparatus And Method Of Controlling Charged Particle Beam Apparatus App 20220216034 - DOBASHI; Takashi ; et al.	2022-07-07
Measurement system and method for setting observation conditions of measurement apparatus Grant 11,380,518 - Miwa , et al. July 5, 2	2022-07-05
Charged particle beam system Grant 11,380,514 - Tamaki July 5, 2	2022-07-05
Charged Particle Beam Device And Control Method Thereof App 20220059313 - Dobashi; Takashi ; et al.	2022-02-24
Charged Particle Beam System App 20220005667 - TAMAKI; Hirokazu	2022-01-06
Measurement System and Method for Setting Observation Conditions of Measurement Apparatus App 20210407763 - MIWA; Takafumi ; et al.	2021-12-30
Charged particle beam device for moving an aperture having plurality of openings and sample observation method Grant 10,636,621 - Hanawa , et al.	2020-04-28
Electron microscope and imaging method Grant 10,535,497 - Tamaki , et al. Ja	2020-01-14
Electron Microscope And Imaging Method App 20190131107 - TAMAKI; Hirokazu ; et al.	2019-05-02
Charged Particle Beam Device and Sample Observation Method App 20180076004 - HANAWA; Akinari ; et al.	2018-03-15
Charged particle beam device and spherical aberration correction method Grant 9,715,991 - Hirayama , et al. July 25, 2	2017-07-25
Charged Particle Beam Device and Spherical Aberration Correction Method App 20170117115 - HIRAYAMA; Yoichi ; et al.	2017-04-27
Phase plate and electron microscope Grant 9,208,990 - Tamaki , et al. December 8, 2	2015-12-08
Phase Plate And Electron Microscope App 20140224988 - Tamaki; Hirokazu ; et al.	2014-08-14
Employment method of virtual tape volume App 20070260787 - Matsuda; Kazumitsu ; et al.	2007-11-08
Employment method of virtual tape volume Grant 7,263,574 - Matsuda , et al. August 28, 2	2007-08-28
Employment method of virtual tape volume App 20060106970 - Matsuda; Kazumitsu ; et al.	2006-05-18

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.