Talbot; Christopher G.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Talbot; Christopher G..The latest application filed is for "controlling an intensity profile of an energy beam in additive manufacturing based on travel direction or velocity".

Company Profile

0.15.9

Talbot; Christopher G. - Emerald Hills CA
Talbot; Christopher G. - Menlo Park CA
Talbot; Christopher G. - Cheltenham GB2

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Controlling an intensity profile of an energy beam in additive manufacturing based on travel direction or velocity Grant 10,421,125 - Ng , et al. Sept	2019-09-24
Controlling an intensity profile of an energy beam with a deformable mirror in additive manufacturing Grant 10,307,822 - Ng , et al.	2019-06-04
Extreme ultraviolet (EUV) substrate inspection system with simplified optics and method of manufacturing thereof Grant 9,915,621 - Foad , et al. March 13, 2	2018-03-13
Controlling An Intensity Profile Of An Energy Beam In Additive Manufacturing Based On Travel Direction Or Velocity App 20180029127 - Ng; Hou T. ; et al.	2018-02-01
Controlling An Intensity Profile Of An Energy Beam With A Deformable Mirror In Additive Manufacturing App 20180029126 - Ng; Hou T. ; et al.	2018-02-01
Extreme Ultraviolet (euv) Substrate Inspection System With Simplified Optics And Method Of Manufacturing Thereof App 20160282280 - Foad; Majeed A. ; et al.	2016-09-29
Contact Opening Metrology App 20070257191 - Kadyshevitch; Alexander ; et al.	2007-11-08
Detection of defects in patterned substrates Grant 7,253,645 - Talbot , et al. August 7, 2	2007-08-07
Contact opening metrology App 20060113471 - Kadyshevitch; Alexander ; et al.	2006-06-01
Detection of defects in patterned substrates App 20050200841 - Talbot, Christopher G. ; et al.	2005-09-15
Detection of defects in patterned substrates Grant 6,914,441 - Talbot , et al. July 5, 2	2005-07-05
Feature-based defect detection Grant 6,539,106 - Gallarda , et al. March 25, 2	2003-03-25
Apparatus for detecting defects in patterned substrates Grant 6,509,750 - Talbot , et al. January 21, 2	2003-01-21
Detection of defects in patterned substrates App 20020166964 - Talbot, Christopher G. ; et al.	2002-11-14
Method of detecting defects in patterned substrates Grant 6,252,412 - Talbot , et al. June 26, 2	2001-06-26
Self-masking FIB milling Grant 5,616,921 - Talbot , et al. April 1, 1	1997-04-01
Method of probing a net of an IC at an optimal probe-point Grant 5,530,372 - Lee , et al. June 25, 1	1996-06-25
Layout overlay for FIB operations Grant 5,401,972 - Talbot , et al. March 28, 1	1995-03-28
Focused ion beam processing with charge control Grant 5,357,116 - Talbot , et al. October 18, 1	1994-10-18
Methods and apparatus for acquiring data from intermittently failing circuits Grant 5,144,225 - Talbot , et al. September 1, 1	1992-09-01
IC modification with focused ion beam system Grant 5,140,164 - Talbot , et al. August 18, 1	1992-08-18
Automatic focusing device with frequency weighted amplification Grant 4,510,384 - Grimbleby , et al. April 9, 1	1985-04-09

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