Talanov; Vladimir V.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Talanov; Vladimir V..The latest application filed is for "stacked superconducting integrated circuits with three dimensional resonant clock networks".

Company Profile

4.19.16

Talanov; Vladimir V. - Ellicott City MD
Talanov; Vladimir V. - Elliott City MD
Talanov; Vladimir V. - Greenbelt MD

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Superconductor ground plane patterning geometries that attract magnetic flux Grant 11,417,821 - Herr , et al. August 16, 2	2022-08-16
Stacked Superconducting Integrated Circuits With Three Dimensional Resonant Clock Networks App 20220208726 - TALANOV; Vladimir V. ; et al.	2022-06-30
Superconductor Ground Plane Patterning Geometries That Attract Magnetic Flux App 20200287118 - HERR; ANNA Y. ; et al.	2020-09-10
Clock distribution resonator system Grant 10,591,952 - Strong , et al.	2020-03-17
Superconducting transmission driver system Grant 10,236,869 - Herr , et al.	2019-03-19
Superconducting Transmission Driver System App 20180145664 - HERR; QUENTIN P. ; et al.	2018-05-24
Clock distribution network for a superconducting integrated circuit Grant 9,722,589 - Talanov , et al. August 1, 2	2017-08-01
Method and system for localization of open defects in electronic devices with a DC squid based RF magnetometer Grant 9,529,035 - Orozco , et al. December 27, 2	2016-12-27
DC SQUID based RF magnetometer operating at a bandwidth of 200 MHz and higher Grant 9,476,951 - Orozco , et al. October 25, 2	2016-10-25
Method And System For Localization Of Open Defects In Electronic Devices With A Dc Squid Based Rf Magnetometer App 20140253111 - Orozco; Antonio ; et al.	2014-09-11
Dc Squid Based Rf Magnetometer Operating At A Bandwidth Of 200 Mhz And Higher App 20140249033 - Orozco; Antonio ; et al.	2014-09-04
Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe Grant 7,362,108 - Talanov , et al. April 22, 2	2008-04-22
Method and system for measurement of dielectric constant of thin films using a near field microwave probe Grant 7,285,963 - Talanov , et al. October 23, 2	2007-10-23
Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits Grant 7,102,363 - Talanov , et al. September 5, 2	2006-09-05
Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe App 20060087305 - Talanov; Vladimir V. ; et al.	2006-04-27
Apertured probes for localized measurements of a material's complex permittivity and fabrication method Grant 6,959,481 - Moreland , et al. November 1, 2	2005-11-01
Method and system for measurement of dielectric constant of thin films using a near field microwave probe App 20050230619 - Talanov, Vladimir V. ; et al.	2005-10-20
Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits App 20050225333 - Talanov, Vladimir V. ; et al.	2005-10-13
Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits Grant 6,943,562 - Talanov , et al. September 13, 2	2005-09-13
System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes Grant 6,856,140 - Talanov , et al. February 15, 2	2005-02-15
Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits App 20040100279 - Talanov, Vladimir V. ; et al.	2004-05-27
Apertured probes for localized measurements of a material's complex permittivity and fabrication method Grant 6,680,617 - Moreland , et al. January 20, 2	2004-01-20
System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes App 20040004484 - Talanov, Vladimir V. ; et al.	2004-01-08
Apertured probes for localized measurements of a material's complex permittivity and fabrication method App 20030155934 - Moreland, Robert L. ; et al.	2003-08-21
Apertured probes for localized measurements of a material's complex permittivity and fabrication method App 20030030449 - Moreland, Robert L. ; et al.	2003-02-13
Apparatus and method for measuring of absolute values of penetration depth and surface resistance of metals and superconductors Grant 6,366,096 - Talanov , et al. April 2, 2	2002-04-02

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