Takizawa; Shigeki
Patent Applications and Registrations
Patent applications and USPTO patent grants for Takizawa; Shigeki.The latest application filed is for "test equipment and test method".
- Takizawa; Shigeki - Saitama JP
- Takizawa; Shigeki - Tokyo JP
| Patent | Date |
|---|---|
| Test equipment Grant 7,876,118 - Iwamoto , et al. January 25, 2 | 2011-01-25 |
| Test apparatus and calibration method Grant 7,802,160 - Takizawa September 21, 2 | 2010-09-21 |
| Test Equipment And Test Method App 20100194421 - IWAMOTO; SATOSHI ; et al. | 2010-08-05 |
| Interconnection substrate, skew measurement method, and test apparatus Grant 7,768,255 - Takizawa August 3, 2 | 2010-08-03 |
| Interconnection Substrate, Skew Measurement Method, And Test Apparatus App 20100052723 - TAKIZAWA; SHIGEKI | 2010-03-04 |
| Test Apparatus And Calibration Method App 20090150733 - Takizawa; Shigeki | 2009-06-11 |
| Test apparatus, correction value managing method, and computer program Grant 7,350,123 - Takizawa March 25, 2 | 2008-03-25 |
| Test apparatus, correction value managing method, and computer program App 20050034043 - Takizawa, Shigeki | 2005-02-10 |
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