TAKEYA; Toshinaga
Patent Applications and Registrations
Patent applications and USPTO patent grants for TAKEYA; Toshinaga.The latest application filed is for "measurement system".
- TAKEYA; Toshinaga - Aomori JP
- Takeya; Toshinaga - Hirosaki JP
- Takeya; Toshinaga - Hirosaki-shi JP
| Patent | Date |
|---|---|
| Measurement System App 20220196570 - OKUTA; Michitaka ; et al. | 2022-06-23 |
| Measurement System And Measurement Method App 20220034714 - OKUTA; Michitaka ; et al. | 2022-02-03 |
| Optical Probe, Optical Probe Array, Test System And Test Method App 20210102864 - OKUTA; Michitaka ; et al. | 2021-04-08 |
| Method for manufacturing probe card Grant 9,015,935 - Takeya April 28, 2 | 2015-04-28 |
| Method for manufacturing probe card Grant 9,015,934 - Takeya April 28, 2 | 2015-04-28 |
| Method For Manufacturing Probe Card App 20120042516 - TAKEYA; Toshinaga | 2012-02-23 |
| Method For Manufacturing Probe Card App 20120042509 - TAKEYA; Toshinaga | 2012-02-23 |
| Contact for electrical test of electronic devices, probe assembly and method for manufacturing the same Grant 8,063,651 - Kamata , et al. November 22, 2 | 2011-11-22 |
| Contact For Electrical Test Of Electronic Devices, Method For Manufacturing The Same, And Probe Assembly App 20090273357 - Kamata; Shoji ; et al. | 2009-11-05 |
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