TAKEUCHI; Koichiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for TAKEUCHI; Koichiro.The latest application filed is for "steam injector and heat pump device".
- TAKEUCHI; Koichiro - Ibaraki JP
- Takeuchi; Koichiro - Hitachinaka N/A JP
- TAKEUCHI; Koichiro - Hitachinaka-shi JP
- Takeuchi; Koichiro - Nishiwaki JP
- Takeuchi; Koichiro - Iwata JP
| Patent | Date |
|---|---|
| Steam Injector And Heat Pump Device App 20160187032 - ABE; Yutaka ; et al. | 2016-06-30 |
| Stage drive device Grant 8,638,026 - Shibahara , et al. January 28, 2 | 2014-01-28 |
| Scanning electron microscope Grant 8,481,935 - Ikegami , et al. July 9, 2 | 2013-07-09 |
| Scanning electron microscope having time constant measurement capability Grant 8,274,048 - Ikegami , et al. September 25, 2 | 2012-09-25 |
| Scanning Electron Microscope App 20110278454 - IKEGAMI; Akira ; et al. | 2011-11-17 |
| Stage Drive Device App 20110260558 - Shibahara; Masashi ; et al. | 2011-10-27 |
| Scanning electron microscope Grant 7,989,768 - Ikegami , et al. August 2, 2 | 2011-08-02 |
| Charged particle beam apparatus and sample manufacturing method Grant 7,928,377 - Ishitani , et al. April 19, 2 | 2011-04-19 |
| Scanning Electron Microscope Having Time Constant Measurement Capability App 20100258723 - IKEGAMI; Akira ; et al. | 2010-10-14 |
| Scanning electron microscope having time constant measurement capability Grant 7,763,852 - Ikegami , et al. July 27, 2 | 2010-07-27 |
| Electron lens and charged particle beam apparatus Grant 7,759,652 - Ohshima , et al. July 20, 2 | 2010-07-20 |
| Focused ION beam apparatus Grant 7,550,740 - Takeuchi , et al. June 23, 2 | 2009-06-23 |
| Electron Microscope App 20090039264 - IKEGAMI; Akira ; et al. | 2009-02-12 |
| Focused ion beam apparatus and focused ion beam irradiation method Grant 7,411,192 - Takeuchi , et al. August 12, 2 | 2008-08-12 |
| Scanning Electron Microscope Having Time Constant Measurement Capability App 20080116375 - Ikegami; Akira ; et al. | 2008-05-22 |
| Electron Lens and Charged Particle Beam Apparatus App 20080067396 - Ohshima; Takashi ; et al. | 2008-03-20 |
| Focused ION Beam Apparatus App 20080023641 - TAKEUCHI; Koichiro ; et al. | 2008-01-31 |
| Charged particle beam apparatus and sample manufacturing method App 20060097166 - Ishitani; Tohru ; et al. | 2006-05-11 |
| Focused ion beam apparatus and focused ion beam irradiation method App 20060022150 - Takeuchi; Koichiro ; et al. | 2006-02-02 |
| Chemical vapor deposition using inductively coupled plasma and system therefor Grant 5,824,158 - Takeuchi , et al. October 20, 1 | 1998-10-20 |
| Intake system for engine Grant 5,253,614 - Matsuo , et al. October 19, 1 | 1993-10-19 |
| Intake system of engines Grant 4,422,415 - Matsuo , et al. December 27, 1 | 1983-12-27 |
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