Takesako; Norihiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Takesako; Norihiro.The latest application filed is for "device and method for inspecting position of probe, and semiconductor evaluation apparatus".

Company Profile

1.9.10

Takesako; Norihiro - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Device and method for inspecting position of probe, and semiconductor evaluation apparatus Grant 10,359,448 - Okada , et al.	2019-07-23
Probe position inspection apparatus, semiconductor device inspection apparatus and semiconductor device inspection method Grant 10,209,273 - Takesako , et al. Feb	2019-02-19
Apparatus and method for evaluating semiconductor device comprising thermal image processing Grant 10,068,814 - Okada , et al. September 4, 2	2018-09-04
Apparatus and method for evaluating semiconductor device Grant 9,995,786 - Okada , et al. June 12, 2	2018-06-12
Evaluation apparatus and probe position inspection method Grant 9,804,197 - Takesako , et al. October 31, 2	2017-10-31
Device And Method For Inspecting Position Of Probe, And Semiconductor Evaluation Apparatus App 20170299630 - OKADA; Akira ; et al.	2017-10-19
Evaluation Apparatus And Probe Position Inspection Method App 20170199225 - TAKESAKO; Norihiro ; et al.	2017-07-13
Semiconductor evaluation apparatus Grant 9,678,143 - Okada , et al. June 13, 2	2017-06-13
Apparatus And Method For Evaluating Semiconductor Device App 20170139002 - OKADA; Akira ; et al.	2017-05-18
Probe Position Inspection Apparatus, Semiconductor Device Inspection Apparatus And Semiconductor Device Inspection Method App 20170102410 - TAKESAKO; Norihiro ; et al.	2017-04-13
Apparatus And Method For Evaluating Semiconductor Device App 20170092553 - OKADA; Akira ; et al.	2017-03-30
Measurement device Grant 9,562,929 - Noguchi , et al. February 7, 2	2017-02-07
Semiconductor testing jig and transfer jig for the same Grant 9,257,316 - Okada , et al. February 9, 2	2016-02-09
Measurement Device App 20150331011 - NOGUCHI; Takaya ; et al.	2015-11-19
Semiconductor Evaluation Apparatus App 20150115989 - OKADA; Akira ; et al.	2015-04-30
Semiconductor Testing Jig And Transfer Jig For The Same App 20150091599 - OKADA; Akira ; et al.	2015-04-02
Test apparatus and test method Grant 8,980,655 - Okada , et al. March 17, 2	2015-03-17
Test Apparatus And Test Method App 20150044788 - OKADA; Akira ; et al.	2015-02-12
Production schedule planning device and a method of producing a semiconductor device using the same App 20020161465 - Takesako, Norihiro ; et al.	2002-10-31

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