Takekoshi; Hidekazu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Takekoshi; Hidekazu.The latest application filed is for "charged particle beam inspection apparatus and charged particle beam inspection method".

Company Profile

0.10.10

Takekoshi; Hidekazu - Fujisawa JP
TAKEKOSHI; Hidekazu - Fujisawa-shi JP
Takekoshi; Hidekazu - Kanagawa JP
Takekoshi; Hidekazu - Ageo JP
Takekoshi, Hidekazu - Ageo-Shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle beam inspection apparatus and charged particle beam inspection method Grant 11,342,157 - Takekoshi May 24, 2	2022-05-24
Charged Particle Beam Inspection Apparatus And Charged Particle Beam Inspection Method App 20210202206 - TAKEKOSHI; Hidekazu	2021-07-01
Multiple electron beam image acquisition apparatus, and alignment method of multiple electron beam optical system Grant 10,896,801 - Inoue , et al. January 19, 2	2021-01-19
Electron beam image acquisition apparatus, and electron beam image acquisition method Grant 10,665,422 - Takekoshi	2020-05-26
Multiple Electron Beam Image Acquisition Apparatus, And Alignment Method Of Multiple Electron Beam Optical System App 20190362928 - INOUE; Kazuhiko ; et al.	2019-11-28
Multi charged particle beam inspection apparatus, and multi charged particle beam inspection method Grant 10,373,798 - Takekoshi	2019-08-06
Position correction method of stage mechanism and charged particle beam lithography apparatus Grant 10,345,724 - Nishimura , et al. July 9, 2	2019-07-09
Electron Beam Image Acquisition Apparatus, and Electron Beam Image Acquisition Method App 20190096631 - Takekoshi; Hidekazu	2019-03-28
Multi Charged Particle Beam Inspection Apparatus, and Multi Charged Particle Beam Inspection Method App 20180286630 - Takekoshi; Hidekazu	2018-10-04
Position Correction Method of Stage Mechanism and Charged Particle Beam Lithography Apparatus App 20180210353 - Nishimura; Rieko ; et al.	2018-07-26
Writing apparatus and writing method Grant 8,421,040 - Takekoshi April 16, 2	2013-04-16
Apparatus and method for charged-particle beam writing Grant 8,030,626 - Takekoshi October 4, 2	2011-10-04
Apparatus And Method For Charged-particle Beam Writing App 20100200773 - TAKEKOSHI; Hidekazu	2010-08-12
Writing Apparatus And Writing Method App 20100032588 - TAKEKOSHI; Hidekazu	2010-02-11
Charged Particle Beam Writing Apparatus And Method Thereof App 20090032738 - TAKEKOSHI; Hidekazu	2009-02-05
Writing Method And Charged Particle Beam Writing Apparatus App 20080299490 - TAKEKOSHI; Hidekazu	2008-12-04
Non-magnetic robotic manipulators for moving objects relative to a charged-particle-beam optical system Grant 6,812,472 - Takekoshi November 2, 2	2004-11-02
Non-magnetic robotic manipulators for moving objects relative to a charged-particle-beam optical system App 20040007677 - Takekoshi, Hidekazu	2004-01-15
Object observing apparatus and method for adjusting the same Grant 6,011,262 - Hamashima , et al. January 4, 2	2000-01-04

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