Takeda; Shinsuke

Patent Applications and Registrations

Patent applications and USPTO patent grants for Takeda; Shinsuke.The latest application filed is for "x-ray apparatus and structure production method".

Company Profile

3.5.7

Takeda; Shinsuke - Osaka JP
Takeda; Shinsuke - Yokohama JP
- Yokohama JP
TAKEDA; Shinsuke - Yokohama-shi JP
Takeda; Shinsuke - Kawasaki JP
TAKEDA; Shinsuke - Kawasaki-shi JP
Takeda; Shinsuke - Sakai-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Ablator, re-entry vehicle and method of manufacturing them Grant 10,647,452 - Tsukahara , et al.	2020-05-12
X-ray apparatus and structure production method Grant 10,571,412 - Tanaka , et al. Feb	2020-02-25
X-ray apparatus and structure production method Grant 10533958 -	2020-01-14
X-ray apparatus and structure production method Grant 10502699 -	2019-12-10
X-ray Apparatus And Structure Production Method App 20170219499 - TANAKA; Toshihisa ; et al.	2017-08-03
Ablator, Re-entry Vehicle And Method Of Manufacturing Them App 20170029140 - TSUKAHARA; Aiichiro ; et al.	2017-02-02
Surface inspection apparatus, method for inspecting surface, exposure system, and method for producing semiconductor device Grant 9,322,788 - Fukazawa , et al. April 26, 2	2016-04-26
Surface Inspection Apparatus, Method For Inspecting Surface, Exposure System, And Method For Producing Semiconductor Device App 20160041108 - FUKAZAWA; Kazuhiko ; et al.	2016-02-11
Surface inspection apparatus, method for inspecting surface, exposure system, and method for producing semiconductor device Grant 9,240,356 - Fukazawa , et al. January 19, 2	2016-01-19
Composition For Heat Insulator, Heat Insulator, And Spacecraft Equipped Therewith App 20140356571 - Watanabe; Junko ; et al.	2014-12-04
Composition For Heat-insulating Material And Heat-insulating Material App 20140037894 - Higuchi; Hisato ; et al.	2014-02-06
Surface Inspection Apparatus, Method For Inspecting Surface, Exposure System, And Method For Producing Semiconductor Device App 20120164763 - FUKAZAWA; Kazuhiko ; et al.	2012-06-28

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.