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name:-0.00094294548034668
name:-0.019581079483032
name:-0.00049901008605957
Takeda Riken Co., Ltd. Patent Filings

Takeda Riken Co., Ltd.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Takeda Riken Co., Ltd..The latest application filed is for "ic test equipment having input magazine replenisher".

Company Profile
0.18.0
  • Takeda Riken Co., Ltd. - Tokyo JP
  • Takeda Riken Co., Ltd. - Gyoda JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
IC test equipment having input magazine replenisher
Grant 4,760,924 - Sato , et al. August 2, 1
1988-08-02
IC test equipment
Grant 4,715,501 - Sato , et al. December 29, 1
1987-12-29
IC test equipment
Grant 4,691,831 - Suzuki , et al. September 8, 1
1987-09-08
Signal detector
Grant 4,620,147 - Niki October 28, 1
1986-10-28
Test pattern generating apparatus
Grant 4,586,181 - Shimizu April 29, 1
1986-04-29
Logic circuit test system
Grant 4,584,683 - Shimizu April 22, 1
1986-04-22
Logic circuit test system
Grant 4,583,041 - Kimura April 15, 1
1986-04-15
Multi-slope analog-to-digital converter
Grant 4,574,271 - Yada March 4, 1
1986-03-04
I/O Control system for data transmission and reception between central processor and I/O units
Grant 4,573,120 - Ichimiya , et al. February 25, 1
1986-02-25
Calibration of a multi-slope A-D converter
Grant 4,559,521 - Yada December 17, 1
1985-12-17
Test pattern generating apparatus
Grant 4,555,663 - Shimizu November 26, 1
1985-11-26
Counter-address memory for multi-channel timing signals
Grant 4,553,100 - Nishiura November 12, 1
1985-11-12
Signal generator for digital spectrum analyzer
Grant 4,539,518 - Kitayoshi September 3, 1
1985-09-03
Interval-expanding timer
Grant 4,523,288 - Hayashi June 11, 1
1985-06-11
IC tester
Grant 4,523,312 - Takeuchi June 11, 1
1985-06-11
Swept frequency signal generator
Grant 4,513,256 - Kurihara , et al. April 23, 1
1985-04-23
Delay pulse generating circuit
Grant 4,504,749 - Yoshida March 12, 1
1985-03-12
IC Tester
Grant 4,497,056 - Sugamori January 29, 1
1985-01-29

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