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Patent applications and USPTO patent grants for TAKASU; Hisayuki.The latest application filed is for "ion milling device and milling processing method using same".
Patent | Date |
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Ion Milling Device and Milling Processing Method Using Same App 20220293391 - KAMOSHIDA; Hitoshi ;   et al. | 2022-09-15 |
Ion Gun And Ion Milling Machine App 20220285123 - Asai; Kengo ;   et al. | 2022-09-08 |
Ion milling apparatus Grant 11,257,654 - Asai , et al. February 22, 2 | 2022-02-22 |
Ion milling device and ion source adjusting method for ion milling device Grant 11,244,802 - Kamoshida , et al. February 8, 2 | 2022-02-08 |
Sample holder, ion milling apparatus, sample processing method, sample observing method, and sample processing and observing method Grant 11,226,273 - Kamino , et al. January 18, 2 | 2022-01-18 |
Ion milling device, ion source, and ion milling method Grant 11,158,481 - Asai , et al. October 26, 2 | 2021-10-26 |
Ion milling device Grant 11,133,153 - Iwaya , et al. September 28, 2 | 2021-09-28 |
Ion Milling Apparatus App 20210287871 - ASAI; Kengo ;   et al. | 2021-09-16 |
Ion Milling Device App 20210265130 - KANEKO; Asako ;   et al. | 2021-08-26 |
Ion Milling Device and Ion Milling Method App 20210193430 - IWAYA; Toru ;   et al. | 2021-06-24 |
Ion Milling Device App 20210183615 - KAMOSHIDA; Hitoshi ;   et al. | 2021-06-17 |
Ion milling device Grant 11,004,652 - Kaneko , et al. May 11, 2 | 2021-05-11 |
Ion Milling Device and Ion Source Adjusting Method for Ion Milling Device App 20210066020 - KAMOSHIDA; Hitoshi ;   et al. | 2021-03-04 |
Ion Milling Device App 20200357602 - KANEKO; Asako ;   et al. | 2020-11-12 |
Charged particle beam device Grant 10,832,889 - Kaneko , et al. November 10, 2 | 2020-11-10 |
Ion milling device and processing method using the ion milling device Grant 10,515,777 - Kamino , et al. Dec | 2019-12-24 |
Charged Particle Beam Device App 20190272973 - KANEKO; Asako ;   et al. | 2019-09-05 |
ION MILLING DEVICE, lON SOURCE, AND ION MILLING METHOD App 20190237291 - ASAI; Kengo ;   et al. | 2019-08-01 |
Ion milling system Grant 10,361,065 - Asai , et al. | 2019-07-23 |
Ion milling device and ion milling method Grant 10,332,722 - Asai , et al. | 2019-06-25 |
Ion milling device, ion source and ion milling method Grant 10,304,653 - Asai , et al. | 2019-05-28 |
Mask position adjustment method of ion milling, electron microscope capable of adjusting mask position, mask adjustment device mounted on sample stage and sample mask component of ion milling device Grant 10,269,534 - Iwaya , et al. | 2019-04-23 |
Sample Holder, Ion Milling Apparatus, Sample Processing Method, Sample Observing Method, and Sample Processing and Observing Method App 20190033182 - KAMINO; Atsushi ;   et al. | 2019-01-31 |
Ion milling apparatus and ion milling method Grant 10,192,710 - Tani , et al. Ja | 2019-01-29 |
Ion Milling Device App 20180301318 - IWAYA; Toru ;   et al. | 2018-10-18 |
Ion Milling System App 20180286633 - ASAI; Kengo ;   et al. | 2018-10-04 |
Mask Position Adjustment Method of Ion Milling, Electron Microscope Capable of Adjusting Mask Position, Mask Adjustment Device Mounted on Sample Stage and Sample Mask Component of Ion Milling Device App 20180277335 - IWAYA; Toru ;   et al. | 2018-09-27 |
Ion milling device Grant 10,008,365 - Iwaya , et al. June 26, 2 | 2018-06-26 |
Ion Milling Apparatus and Ion Milling Method App 20180130630 - TANI; Yuki ;   et al. | 2018-05-10 |
Ion milling apparatus and sample processing method Grant 9,761,412 - Horinouchi , et al. September 12, 2 | 2017-09-12 |
Ion Milling Device, Ion Source And Ion Milling Method App 20170221671 - ASAI; Kengo ;   et al. | 2017-08-03 |
Ion Milling Device And Ion Milling Method App 20170221677 - ASAI; Kengo ;   et al. | 2017-08-03 |
Ion Milling Apparatus and Sample Processing Method App 20170047198 - HORINOUCHI; Kento ;   et al. | 2017-02-16 |
Ion milling device Grant 9,558,912 - Kaneko , et al. January 31, 2 | 2017-01-31 |
Ion milling device Grant 9,499,900 - Kamino , et al. November 22, 2 | 2016-11-22 |
Ion Milling Device App 20160163508 - IWAYA; Toru ;   et al. | 2016-06-09 |
Ion Milling Device and Processing Method Using the Ion Milling Device App 20160155602 - KAMINO; Atsushi ;   et al. | 2016-06-02 |
Ion milling device and ion milling processing method Grant 9,355,817 - Watanabe , et al. May 31, 2 | 2016-05-31 |
Charged particle beam irradiation apparatus Grant 9,343,265 - Kaneko , et al. May 17, 2 | 2016-05-17 |
Ion Milling Device App 20160126057 - KANEKO; Asako ;   et al. | 2016-05-05 |
Ion Milling Device App 20150008121 - Kamino; Atsushi ;   et al. | 2015-01-08 |
Charged Particle Beam Irradiation Apparatus App 20140353151 - Kaneko; Asako ;   et al. | 2014-12-04 |
Sample Preparation Apparatus, Sample Preparation Method, And Charged Particle Beam Apparatus Using The Same App 20140124367 - Takeuchi; Shuichi ;   et al. | 2014-05-08 |
Ion Milling Device And Ion Milling Processing Method App 20130240353 - Watanabe; Shunya ;   et al. | 2013-09-19 |
Ion Milling Device App 20130220806 - Iwaya; Toru ;   et al. | 2013-08-29 |
Ion Milling Device, Sample Processing Method, Processing Device, and Sample Drive Mechanism App 20120298884 - Nakajima; Rie ;   et al. | 2012-11-29 |
Method of developing a resist film and a resist development processor Grant 7,179,000 - Takasu , et al. February 20, 2 | 2007-02-20 |
Method of developing a resist film and a resist development processor App 20060140624 - Takasu; Hisayuki ;   et al. | 2006-06-29 |
Method of developing a resist film and a resist development processor Grant 7,033,089 - Takasu , et al. April 25, 2 | 2006-04-25 |
Method of developing a resist film and a resist development processor App 20040096210 - Takasu, Hisayuki ;   et al. | 2004-05-20 |
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