Takashina; Nobuaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Takashina; Nobuaki.The latest application filed is for "nonvolatile semiconductor memory device having electrically and collectively erasable characteristics".

Company Profile

0.6.5

Takashina; Nobuaki - Kawasaki JP
Takashina, Nobuaki - Kawasaki-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Nonvolatile semiconductor memory device having electrically and collectively erasable characteristics Grant 6,646,920 - Takashina , et al. November 11, 2	2003-11-11
Nonvolatile semiconductor memory device having electrically and collectively erasable characteristics App 20030198083 - Akaogi, Takao ; et al.	2003-10-23
Nonvolatile semiconductor memory device having electrically and collectively erasable characteristics Grant 6,611,464 - Akaogi , et al. August 26, 2	2003-08-26
Nonvolatile semiconductor memory device having electrically and collectively erasable characteristics App 20030039139 - Akaogi, Takao ; et al.	2003-02-27
Nonvolatile semiconductor memory device having electrically and collectively erasable characteristics App 20030031049 - Takashina, Nobuaki ; et al.	2003-02-13
Nonvolatile semiconductor memory device having electrically and collectively erasable characteristics App 20020136057 - Akaogi, Takao ; et al.	2002-09-26
Nonvolatile semiconductor memory device having electrically and collectively erasable characteristics App 20010015932 - Akaogi, Takao ; et al.	2001-08-23
Electrically erasable programmable nonvolatile semiconductor memory having dual operation function Grant 5,959,887 - Takashina , et al. September 28, 1	1999-09-28
Non-volatile semiconductor memory device Grant 5,463,583 - Takashina October 31, 1	1995-10-31
Semiconductor memory device for selecting and deselecting blocks of word lines Grant 5,452,251 - Akaogi , et al. September 19, 1	1995-09-19
Frasable non-volatile semiconductor memory device having read/write test function Grant 5,237,530 - Takashina , et al. August 17, 1	1993-08-17

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