Takase; Shinichiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for Takase; Shinichiro.The latest application filed is for "contact structure for inspection".
- Takase; Shinichiro - Nirasaki N/A JP
- TAKASE; Shinichiro - Nirasaki City JP
- Takase; Shinichiro - Nirasaki-shi JP
| Patent | Date |
|---|---|
| Probe card having a structure for being prevented from deforming Grant 8,415,964 - Yonezawa , et al. April 9, 2 | 2013-04-09 |
| Probe device having a structure for being prevented from deforming Grant 8,319,511 - Yonezawa , et al. November 27, 2 | 2012-11-27 |
| Contact structure for inspection Grant 8,310,257 - Takase , et al. November 13, 2 | 2012-11-13 |
| Contact Structure For Inspection App 20110043232 - TAKASE; Shinichiro ; et al. | 2011-02-24 |
| Method For Manufacturing Probe Supporting Plate, Computer Storage Medium And Probe Supporting Plate App 20110006799 - Mochizuki; Jun ; et al. | 2011-01-13 |
| Probe Device App 20100301888 - Yonezawa; Toshihiro ; et al. | 2010-12-02 |
| Probe Card App 20100301887 - Yonezawa; Toshihiro ; et al. | 2010-12-02 |
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