Takase; Nobumitsu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Takase; Nobumitsu.The latest application filed is for "cover for vitreous silica crucible and vitreous silica crucible and method of handling the same".

Company Profile

0.11.14

Takase; Nobumitsu - Tokyo N/A JP
Takase; Nobumitsu - Minato-ku JP
Takase; Nobumitsu - Saga JP
Takase; Nobumitsu - Saga-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of manufacturing silicon single crystal, apparatus for pulling silicon single crystal and vitreous silica crucible Grant 8,696,813 - Fukui , et al. April 15, 2	2014-04-15
Cover For Vitreous Silica Crucible And Vitreous Silica Crucible And Method Of Handling The Same App 20120270167 - Sato; Masaru ; et al.	2012-10-25
Method Of Manufacturing Silicon Single Crystal, Apparatus For Pulling Silicon Single Crystal And Vitreous Silica Crucible App 20100326349 - FUKUI; Masanori ; et al.	2010-12-30
Method for growing silicon single crystal and method for manufacturing silicon wafer Grant 7,819,972 - Inami , et al. October 26, 2	2010-10-26
Seed Crystal For Pulling Silicon Single Crystal And Method For Manufacturing Silicon Single Crystal By Using The Seed Crystal App 20100242832 - Takase; Nobumitsu	2010-09-30
Silicon single crystal and method of producing the same App 20090311160 - Saito; Yasuhiro ; et al.	2009-12-17
Method for growing silicon single crystal App 20090260564 - SAITO; Yasuhiro ; et al.	2009-10-22
Method for growing silicon single crystal Grant 7,473,314 - Inami , et al. January 6, 2	2009-01-06
Method for producing silicon single crystals and silicon single crystal produced thereby Grant 7,442,251 - Inami , et al. October 28, 2	2008-10-28
High resistance silicon wafer and its manufacturing method Grant 7,397,110 - Takase , et al. July 8, 2	2008-07-08
High-resistance silicon wafer and process for producing the same Grant 7,316,745 - Sadamitsu , et al. January 8, 2	2008-01-08
Silicon annealed wafer and silicon epitaxial wafer Grant 7,273,647 - Nishikawa , et al. September 25, 2	2007-09-25
High resistivity silicon wafer and method for fabricating the same Grant 7,226,571 - Takase , et al. June 5, 2	2007-06-05
Manufacturing method of high resistivity silicon single crystal Grant 7,220,308 - Takase , et al. May 22, 2	2007-05-22
Device and method for measuring position of liquid surface or melt in single-crystal-growing apparatus Grant 7,172,656 - Takanashi , et al. February 6, 2	2007-02-06
Method for producing silicon single crystals and silicon single crystal produced thereby App 20060283377 - Inami; Shuichi ; et al.	2006-12-21
Method for growing silicon single crystal App 20060283373 - Inami; Shuichi ; et al.	2006-12-21
Method for growing silicon single crystal and method for manufacturing silicon wafer App 20060283379 - Inami; Shuichi ; et al.	2006-12-21
High resistance silicon wafer and method for production thereof App 20050253221 - Takase, Nobumitsu ; et al.	2005-11-17
High-resistance silicon wafer and process for producing the same App 20050250349 - Sadamitsu, Shinsuke ; et al.	2005-11-10
High resistivity silicon wafer and method for fabricating the same App 20050127477 - Takase, Nobumitsu ; et al.	2005-06-16
Manufacturing method of high resistivity silicon single crystal App 20050000410 - Takase, Nobumitsu ; et al.	2005-01-06
Device and method for measuring position of liquid surface of melt in single-crystal-growing apparatus App 20040221794 - Takanashi, Keiichi ; et al.	2004-11-11
Silicon annealed wafer and silicon epitaxial wafer App 20040194692 - Nishikawa, Hideshi ; et al.	2004-10-07

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.