Takamatsu; Tomohiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Takamatsu; Tomohiro.The latest application filed is for "plasma processing method".

Company Profile

1.14.15

Takamatsu; Tomohiro - Tokyo JP
Takamatsu; Tomohiro - Kuwana JP
Takamatsu; Tomohiro - Kawasaki JP
Takamatsu; Tomohiro - Iwate JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Plasma processing method Grant 11,257,678 - Takamatsu , et al. February 22, 2	2022-02-22
Plasma Processing Method App 20200357650 - TAKAMATSU; Tomohiro ; et al.	2020-11-12
Semiconductor memory device and method for manufacturing the same Grant 9,666,596 - Takamatsu May 30, 2	2017-05-30
Semiconductor Memory Device And Method For Manufacturing The Same App 20170062461 - TAKAMATSU; Tomohiro	2017-03-02
Manufacturing method of a semiconductor device Grant 8,652,854 - Takamatsu , et al. February 18, 2	2014-02-18
Manufacturing Method Of A Semiconductor Device App 20120171785 - Takamatsu; Tomohiro ; et al.	2012-07-05
Manufacturing method of a semiconductor device Grant 8,153,448 - Takamatsu , et al. April 10, 2	2012-04-10
Inspection method for semiconductor memory Grant 7,982,466 - Hikosaka , et al. July 19, 2	2011-07-19
Semiconductor device and fabricating method thereof Grant 7,892,916 - Takamatsu , et al. February 22, 2	2011-02-22
Manufacturing method of a semiconductor device App 20090280577 - TAKAMATSU; Tomohiro ; et al.	2009-11-12
Semiconductor device and manufacturing method of a semiconductor device Grant 7,547,933 - Takamatsu , et al. June 16, 2	2009-06-16
Semiconductor device and manufacturing method thereof Grant 7,498,625 - Takamatsu , et al. March 3, 2	2009-03-03
Semiconductor device and manufacturing method thereof App 20070184595 - Miura; Jirou ; et al.	2007-08-09
Semiconductor device with specifically shaped contact holes Grant 7,211,850 - Miura , et al. May 1, 2	2007-05-01
Inspection method for semiconductor memory App 20070058416 - Hikosaka; Yukinobu ; et al.	2007-03-15
Semiconductor device and fabricating method thereof App 20060118847 - Takamatsu; Tomohiro ; et al.	2006-06-08
Semiconductor device and manufacturing method thereof App 20060091438 - Takamatsu; Tomohiro ; et al.	2006-05-04
Process for producing high quality PZT films for ferroelectric memory integrated circuits Grant 6,887,716 - Fox , et al. May 3, 2	2005-05-03
Semiconductor device and manufacturing method thereof App 20050072998 - Miura, Jirou ; et al.	2005-04-07
Ferroelectric capacitor with electrode formed in separate oxidizing conditions Grant 6,825,515 - Takamatsu November 30, 2	2004-11-30
Semiconductor device and method of manufacturing the same App 20040212041 - Takamatsu, Tomohiro ; et al.	2004-10-28
Semiconductor device and manufacturing method of a semiconductor device App 20040113189 - Takamatsu, Tomohiro ; et al.	2004-06-17
Semiconductor device having a ferroelectric capacitor and fabrication process thereof Grant 6,740,533 - Takamatsu , et al. May 25, 2	2004-05-25
Semiconductor device having a ferroelectric capacitor and fabrication process thereof App 20030213986 - Takamatsu, Tomohiro ; et al.	2003-11-20
Semiconductor device having a ferroelectric capacitor and fabrication process thereof Grant 6,624,458 - Takamatsu , et al. September 23, 2	2003-09-23
Ferroelectric Capacitor With Electrode Formed In Separate Oxidizing Conditions App 20030122176 - Takamatsu, Tomohiro	2003-07-03
Semiconductor device having a ferroelectric capacitor and fabrication process thereof App 20020185668 - Takamatsu, Tomohiro ; et al.	2002-12-12
Process for producing high quality PZT films for ferroelectric memory integrated circuits App 20020074601 - Fox, Glen ; et al.	2002-06-20

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.