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Takahashi; Naohiro Patent Filings

Takahashi; Naohiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Takahashi; Naohiro.The latest application filed is for "transparent electrode device, information input device, and electronic equipment".

Company Profile
0.20.16
  • Takahashi; Naohiro - Miyagi N/A JP
  • Takahashi; Naohiro - Tokyo N/A JP
  • Takahashi; Naohiro - Kawasaki JP
  • Takahashi; Naohiro - Shinjuku-ku JP
  • Takahashi; Naohiro - Kawasaki-shi JP
  • Takahashi, Naohiro - Kanagawa JP
  • Takahashi; Naohiro - Wako JP
  • Takahashi; Naohiro - Saitama JP
  • Takahashi; Naohiro - Tochigi-ken JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Transparent electrode device, information input device, and electronic equipment
Grant 8,889,244 - Mizuno , et al. November 18, 2
2014-11-18
Sensor apparatus and information processing apparatus
Grant 8,711,122 - Wada , et al. April 29, 2
2014-04-29
Defect inspection apparatus and method of defect inspection
Grant 8,538,131 - Yasumoto , et al. September 17, 2
2013-09-17
Transparent Electrode Device, Information Input Device, And Electronic Equipment
App 20130004709 - Mizuno; Mikihisa ;   et al.
2013-01-03
Defect review apparatus and method for wafer
Grant 8,339,450 - Takahashi December 25, 2
2012-12-25
Defect inspection apparatus, defect inspection method, and manufacture method for semiconductor device
Grant 8,270,703 - Takahashi , et al. September 18, 2
2012-09-18
Sensor Apparatus And Information Processing Apparatus
App 20120068965 - Wada; Yutaka ;   et al.
2012-03-22
Sensor Element And Display Apparatus
App 20110181545 - Takahashi; Naohiro ;   et al.
2011-07-28
Defect inspection method and apparatus with a threshold value determination
Grant 7,948,618 - Takahashi , et al. May 24, 2
2011-05-24
Defect inspection apparatus, sensitivity calibration method for the same, substrate for defect detection sensitivity calibration, and manufacturing method thereof
Grant 7,755,753 - Takahashi , et al. July 13, 2
2010-07-13
Defect Review Apparatus And Method For Wafer
App 20100128119 - Takahashi; Naohiro
2010-05-27
Method, system and apparatus of inspection
Grant 7,679,737 - Takahashi , et al. March 16, 2
2010-03-16
Surface inspection device and method
Grant 7,653,236 - Takahashi January 26, 2
2010-01-26
Defect Inspection Apparatus, Defect Inspection Method, And Manufacture Method For Semiconductor Device
App 20090304261 - TAKAHASHI; Naohiro ;   et al.
2009-12-10
Method, System And Apparatus Of Inspection
App 20080165352 - TAKAHASHI; Naohiro ;   et al.
2008-07-10
Semiconductor wafer defect inspection method and apparatus
App 20080073523 - Takahashi; Naohiro ;   et al.
2008-03-27
Inspecting method, inspecting apparatus, and method of manufacturing semiconductor device
Grant 7,340,352 - Takahashi , et al. March 4, 2
2008-03-04
Defect inspection method and apparatus
App 20070285653 - Takahashi; Naohiro ;   et al.
2007-12-13
Inspecting method, inspecting apparatus, and method of manufacturing semiconductor device
App 20070255513 - Takahashi; Naohiro ;   et al.
2007-11-01
Defect inspection apparatus and method of defect inspection
App 20070230769 - Yasumoto; Tamihide ;   et al.
2007-10-04
Defect inspection apparatus, sensitivity calibration method for the same, substrate for defect detection sensitivity calibration, and manufacturing method thereof
App 20070035725 - Takahashi; Naohiro ;   et al.
2007-02-15
Defect inspection apparatus, sensitivity calibration method for the same, substrate for defect detection sensitivity calibration, and manufacturing method thereof
App 20070035726 - Takahashi; Naohiro ;   et al.
2007-02-15
Surface inspection method and surface inspection system
Grant 7,064,820 - Isozaki , et al. June 20, 2
2006-06-20
Surface inspection device and method
App 20060056676 - Takahashi; Naohiro
2006-03-16
Surface inspection method and surface inspection system
App 20030184744 - Isozaki, Hisashi ;   et al.
2003-10-02
Portable information terminal
App 20030011564 - Ushino, Tatsuji ;   et al.
2003-01-16
Side-collision air bag device
Grant 6,386,577 - Kan , et al. May 14, 2
2002-05-14
Seat having seat surface portion made of surface-like elastic body
Grant 6,378,949 - Maeda , et al. April 30, 2
2002-04-30
Holder for mounting an air bag module
App 20020024198 - Umezawa, Fumio ;   et al.
2002-02-28
Seat with resilient sheet-formed seat cushion
Grant 6,231,125 - Maeda , et al. May 15, 2
2001-05-15
Seat having seating face made of sheet resilient material
Grant 6,152,534 - Maeda , et al. November 28, 2
2000-11-28
Seat structure for a vehicle
Grant 5,951,084 - Okazaki , et al. September 14, 1
1999-09-14
Process for producing antimony-containing oxide catalyst with improved strength
Grant 4,587,226 - Sasaki , et al. May 6, 1
1986-05-06

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