loadpatents
name:-0.017833948135376
name:-0.014287948608398
name:-0.00043702125549316
TAKAHAMA; Takashi Patent Filings

TAKAHAMA; Takashi

Patent Applications and Registrations

Patent applications and USPTO patent grants for TAKAHAMA; Takashi.The latest application filed is for "x-ray detector and x-ray measurement device using the same".

Company Profile
0.12.14
  • TAKAHAMA; Takashi - Tokyo JP
  • Takahama; Takashi - Higashimurayama N/A JP
  • Takahama; Takashi - Amagasaki JP
  • Takahama; Takashi - Hyogo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
X-ray Detector And X-ray Measurement Device Using The Same
App 20190324160 - HOZAWA; Kazuyuki ;   et al.
2019-10-24
Optical modulator and method for manufacturing same
Grant 9,857,610 - Arimoto , et al. January 2, 2
2018-01-02
Silicon carbide semiconductor device and method for producing same
Grant 9,825,166 - Tega , et al. November 21, 2
2017-11-21
Image processing device, charged particle beam device, charged particle beam device adjustment sample, and manufacturing method thereof
Grant 9,702,695 - Kawada , et al. July 11, 2
2017-07-11
Optical Modulator And Method For Manufacturing Same
App 20170082877 - ARIMOTO; Hideo ;   et al.
2017-03-23
Silicon carbide semiconductor device and manufacturing method of the same
Grant 9,490,328 - Tega , et al. November 8, 2
2016-11-08
Silicon Carbide Semiconductor Device And Manufacturing Method Of The Same
App 20160141371 - TEGA; Naoki ;   et al.
2016-05-19
Silicon Carbide Semiconductor Device And Method For Producing Same
App 20150349115 - TEGA; Naoki ;   et al.
2015-12-03
Silicon carbide semiconductor device and method for producing the same
Grant 8,872,193 - Tega , et al. October 28, 2
2014-10-28
Silicon Carbide Semiconductor Device And Method For Producing The Same
App 20130299849 - Tega; Naoki ;   et al.
2013-11-14
Image Processing Device, Charged Particle Beam Device, Charged Particle Beam Device Adjustment Sample, and Manufacturing Method Thereof
App 20130146763 - Kawada; Hiroki ;   et al.
2013-06-13
Semiconductor device and manufacturing method thereof
App 20040245583 - Horiuchi, Masatada ;   et al.
2004-12-09
Manufacturing semiconductor device including forming a buried gate covered by an insulative film and a channel layer
Grant 6,800,513 - Horiuchi , et al. October 5, 2
2004-10-05
Insulated gate field effect transistor and method of fabricating the same
App 20040132241 - Horiuchi, Masatada ;   et al.
2004-07-08
Field effect transistor and method of fabricating the same by controlling distribution condition of impurity region with implantation of additional ion
Grant 6,690,060 - Horiuchi , et al. February 10, 2
2004-02-10
Semiconductor device and method of fabricating the same
App 20030227062 - Horiuchi, Masatada ;   et al.
2003-12-11
Semiconductor device and process for forming same
App 20030146458 - Horiuchi, Masatada ;   et al.
2003-08-07
Semiconductor device and manufacturing method thereof
App 20030113961 - Horiuchi, Masatada ;   et al.
2003-06-19
Insulated gate field effect transistor and manufacturing thereof
App 20030008462 - Horiuchi, Masatada ;   et al.
2003-01-09
Insulated gate field effect transistor and method of fabricating the same
App 20020024078 - Horiuchi, Masatada ;   et al.
2002-02-28
Printed circuit board with busbar interconnections
Grant 5,065,283 - Adachi , et al. November 12, 1
1991-11-12
Method of resin encapsulating a semiconductor device
Grant 4,769,344 - Sakai , et al. September 6, 1
1988-09-06
Semiconductor device
Grant 4,717,948 - Sakai , et al. January 5, 1
1988-01-05
Semiconductor device and manufacturing method therefor
Grant 4,697,203 - Sakai , et al. September 29, 1
1987-09-29

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