Tajima; Ryo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tajima; Ryo.The latest application filed is for "adjustment method and electron beam device".

Company Profile

4.16.19

Tajima; Ryo - Tokyo JP
Tajima; Ryo - Kanagawa-ken JP
TAJIMA; Ryo - Nagoya-shi JP
Tajima; Ryo - Nagoya JP
Tajima; Ryo - Fujisawa JP
Tajima; Ryo - Fujisawa-shi JP
Tajima; Ryo - Yokohama JP
TAJIMA; Ryo - Kasugai-shi Aichi-ken

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Adjustment method and electron beam device Grant 11,217,421 - Hayashi , et al. January 4, 2	2022-01-04
Adjustment Method And Electron Beam Device App 20210012997 - HAYASHI; Takehide ; et al.	2021-01-14
Electron Beam Irradiation Apparatus App 20200411275 - TAJIMA; Ryo	2020-12-31
Electron Beam Irradiation Apparatus And Electron Beam Alignment Method App 20200273658 - WATANABE; Kenji ; et al.	2020-08-27
Deflection sensitivity calculation method and deflection sensitivity calculation system Grant 10,707,048 - Tajima	2020-07-07
Electron-beam irradiated area adjustment method and adjustment system, electron-beam irradiated region correction method, and electron beam irradiation apparatus Grant 10,446,404 - Tajima , et al. Oc	2019-10-15
Deflection Sensitivity Calculation Method And Deflection Sensitivity Calculation System App 20190237293 - TAJIMA; Ryo	2019-08-01
Electron-beam Irradiated Area Adjustment Method And Adjustment System, Electron-beam Irradiated Region Correction Method, And Electron Beam Irradiation Apparatus App 20180233374 - TAJIMA; Ryo ; et al.	2018-08-16
Inspection device Grant 10,002,740 - Hatakeyama , et al. June 19, 2	2018-06-19
Inspection Device App 20180040452 - HATAKEYAMA; Masahiro ; et al.	2018-02-08
Surface processing apparatus Grant 9,852,878 - Hatakeyama , et al. December 26, 2	2017-12-26
Testing apparatus using charged particles and device manufacturing method using the testing apparatus Grant 9,406,480 - Noji , et al. August 2, 2	2016-08-02
Surface Processing Apparatus App 20150371813 - HATAKEYAMA; Masahiro ; et al.	2015-12-24
Inspection system, inspection image data generation method, inspection display unit, defect determination method, and storage medium on which inspection display program is recorded Grant 9,105,445 - Tajima , et al. August 11, 2	2015-08-11
Testing Apparatus Using Charged Particles And Device Manufacturing Method Using The Testing Apparatus App 20150122993 - Noji; Nobuharu ; et al.	2015-05-07
Testing apparatus using charged particles and device manufacturing method using the testing apparatus Grant 8,946,631 - Noji , et al. February 3, 2	2015-02-03
Inspection System, Inspection Image Data Generation Method, Inspection Display Unit, Defect Determination Method, And Storage Medium On Which Inspection Display Program Is Recorded App 20140291515 - TAJIMA; Ryo ; et al.	2014-10-02
Testing Apparatus Using Charged Particles And Device Manufacturing Method Using The Testing Apparatus App 20140158885 - Noji; Nobuharu ; et al.	2014-06-12
Testing apparatus using charged particles and device manufacturing method using the testing apparatus Grant 8,742,341 - Noji , et al. June 3, 2	2014-06-03
Embroidery Sewing Machine App 20120234224 - TAJIMA; Ryo	2012-09-20
Embroidery sewing machine and control method therefor Grant 8,256,362 - Tajima , et al. September 4, 2	2012-09-04
Charged particle beam apparatus, method of adjusting astigmatism using same and method of manufacturing device using same Grant 8,013,315 - Watanabe , et al. September 6, 2	2011-09-06
Sewing machine capable of sewing sequins and method for setting sequin feed amount therefor Grant 7,934,461 - Tajima May 3, 2	2011-05-03
Testing apparatus using charged particles and device manufacturing method using the testing apparatus App 20100237243 - Noji; Nobuharu ; et al.	2010-09-23
Testing apparatus using charged particles and device manufacturing method using the testing apparatus Grant 7,741,601 - Noji , et al. June 22, 2	2010-06-22
Semiconductor Devices And Method Of Testing Same App 20090152595 - Kaga; Toru ; et al.	2009-06-18
Testing apparatus using charged particles and device manufacturing method using the testing apparatus App 20090101816 - Noji; Nobuharu ; et al.	2009-04-23
Embroidery Sewing Machine And Control Method Therefor App 20080302287 - TAJIMA; Ryo ; et al.	2008-12-11
Charged particle beam apparatus, method of adjusting astigmatism using same and method of manufacturing device using same App 20080099697 - Watanabe; Kenji ; et al.	2008-05-01
Testing apparatus using charged particles and device manufacturing method using the testing apparatus Grant 7,365,324 - Noji , et al. April 29, 2	2008-04-29
Sewing Machine Capable Of Sewing Sequins And Method For Setting Sequin Feed Amount Therefor App 20070119357 - TAJIMA; Ryo	2007-05-31
Testing apparatus using charged particles and device manufacturing method using the testing apparatus Grant 7,138,629 - Noji , et al. November 21, 2	2006-11-21
Testing apparatus using charged particles and device manufacturing method using the testing apparatus App 20060169900 - Noji; Nobuharu ; et al.	2006-08-03
Testing apparatus using charged particles and device manufacturing method using the testing apparatus App 20050045821 - Noji, Nobuharu ; et al.	2005-03-03

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