loadpatents
name:-0.03274393081665
name:-0.0023488998413086
name:-0.00050497055053711
Taiwan Semicondutor Manufacturing Co. Patent Filings

Taiwan Semicondutor Manufacturing Co.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Taiwan Semicondutor Manufacturing Co..The latest application filed is for "novel method to reduce rs pattern dependence effect".

Company Profile
0.1.25
  • Taiwan Semicondutor Manufacturing Co. -
  • Taiwan Semicondutor Manufacturing Company - Hsin-Chu TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Reference generator for multilevel nonlinear resistivity memory storage elements
App 20050083747 - Tang, Denny D. ;   et al.
2005-04-21
Novel method to reduce Rs pattern dependence effect
App 20050085066 - Tsao, Jung-Chih ;   et al.
2005-04-21
Pad structure for stress relief
App 20050074918 - Lee, Tze-Liang ;   et al.
2005-04-07
Smart overlay control
App 20050071033 - Cheng, Kun-Pi ;   et al.
2005-03-31
Method for providing VITAL model of embedded memory with delay back annotation
App 20050071144 - Sung, Nai-Yin ;   et al.
2005-03-31
Novel method to control spacer width
App 20050064722 - Hsu, Jyh-Shiou ;   et al.
2005-03-24
Multi-layered metal routing technique
App 20050056936 - Jan, Tzong-Shi
2005-03-17
Method to shrink cell size in a split gate flash
App 20050059249 - Hsieh, Chia-Ta
2005-03-17
Web service and method for customers to define their own alert for real-time production status
App 20050060056 - Ta, Hsu Ming
2005-03-17
Constant and reducible hole bottom CD in variable post-CMP thickness and after-development-inspection CD
App 20050059251 - Kao, Chi-An ;   et al.
2005-03-17
Phase shift assignments for alternate PSM
App 20050053846 - Shin, Jaw-Jung ;   et al.
2005-03-10
Mim Capacitor Having A High-dielectric-constant Interelectrode Insulator And A Method Of Fabrication
App 20050048713 - Tseng, Horng-Huei
2005-03-03
CD sem automatic focus methodology and apparatus for constant electron beam dosage control
App 20050023463 - Ke, Chih-Ming ;   et al.
2005-02-03
Novel dual bit split gate flash memory
App 20040262668 - Wang, Shih-Wei
2004-12-30
Shared contact for high-density memory cell design
App 20040256732 - Liaw, Jhon-Jhy
2004-12-23
Method of forming dual gate insulator layers for CMOS applications
App 20040259341 - Chen, Chi-Chun ;   et al.
2004-12-23
Shallow trench isolation structure with low sidewall capacitance for high speed integrated circuits
App 20040251513 - Su, Ke-Wei ;   et al.
2004-12-16
Method of fabricating a high performance MOSFET device featuring formation of an elevated source/drain region
App 20040248369 - Wang, Yin-Pin ;   et al.
2004-12-09
Edge peeling improvement of low-k dielectric materials stack by adjusting EBR resistance
App 20040248426 - Chou, Tzu-Jen ;   et al.
2004-12-09
Water soluble negative tone photoresist
App 20040234897 - Ho, Bang-Chein ;   et al.
2004-11-25
Method to remove copper without pattern density effect
App 20040224509 - Chou, Shih-Wei ;   et al.
2004-11-11
Maintaining photoresist planarity at hole edges
App 20040214112 - Cheng, Su-Jen ;   et al.
2004-10-28
Atomic layer deposited tantalum nitride layer to improve adhesion between a copper structure and overlying materials
App 20040214425 - Lin, Jing-Cheng ;   et al.
2004-10-28
Method of forming a metal-insulator - metal capacitor structure in a copper damascene process sequence
App 20040201057 - Lien, Wan-Yih ;   et al.
2004-10-14
Method of forming tiny silicon nitride spacer for flash EPROM by fully wet etching technology
App 20040203205 - Liu, Hung-Hsin ;   et al.
2004-10-14
Method to improve the adhesion of a molding compound to a semiconductor chip comprised with copper damascene structures
Grant 6,090,696 - Jang , et al. July 18, 2
2000-07-18

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