Taira; Takashi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Taira; Takashi.The latest application filed is for "semiconductor storage device".

Company Profile

3.7.10

Taira; Takashi - Yokohama Kanagawa JP
Taira; Takashi - Miyagi JP
Taira; Takashi - Kanagawa-ken JP
Taira; Takashi - Yokohama JP
Taira; Takashi - Kanagawa JP
Taira, Takashi - Yokohama-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor storage device Grant 11,417,404 - Taira August 16, 2	2022-08-16
Apparatus for processing substrate and method for detecting a presence of a focus ring on a stage Grant 11,264,267 - Miyadate , et al. March 1, 2	2022-03-01
Semiconductor Storage Device App 20220051731 - TAIRA; Takashi	2022-02-17
Dielectric Member, Structure, And Substrate Processing Apparatus App 20210090864 - TAIRA; Takashi	2021-03-25
Edge Ring, Substrate Support, Substrate Processing Apparatus And Method App 20210035783 - TAIRA; Takashi ; et al.	2021-02-04
Apparatus For Processing Substrate And Method For Detecting A Presence Of A Focus Ring On A Stage App 20200303235 - MIYADATE; Takaharu ; et al.	2020-09-24
Plasma Processing Apparatus App 20200098550 - TAKAHASHI; Shuichi ; et al.	2020-03-26
Method Of Manufacturing Semiconductor Device, And Semiconductor Device App 20090051020 - Taira; Takashi ; et al.	2009-02-26
Semiconductor storage device formed to optimize test technique and redundancy technology Grant 7,079,432 - Kato , et al. July 18, 2	2006-07-18
Semiconductor storage device Grant 7,027,335 - Ito , et al. April 11, 2	2006-04-11
Semiconductor storage device formed to optimize test technique and redundancy technology App 20050122802 - Kato, Daisuke ; et al.	2005-06-09
Semiconductor storage device formed to optimize test technique and redundancy technology Grant 6,876,588 - Kato , et al. April 5, 2	2005-04-05
Semiconductor storage device App 20040141382 - Ito, Mikihiko ; et al.	2004-07-22
Semiconductor storage device formed to optimize test technique and redundancy technology Grant 6,741,509 - Kato , et al. May 25, 2	2004-05-25
Semiconductor storage device formed to optimize test technique and redundancy technology App 20040062134 - Kato, Daisuke ; et al.	2004-04-01
Semiconductor storage device formed to optimize test technique and redundancy technology App 20020114198 - Kato, Daisuke ; et al.	2002-08-22
Semiconductor device Grant 6,081,468 - Taira , et al. June 27, 2	2000-06-27

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