Tai; Hung-En

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tai; Hung-En.The latest application filed is for "dispatch integration system and method based on semiconductor manufacturing".

Company Profile

0.11.13

Tai; Hung-En - Taipei Hsien TW
Tai; Hung-En - Taipei County TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of managing wafer defects Grant 7,412,090 - Tai , et al. August 12, 2	2008-08-12
Dispatch Integration System And Method Based On Semiconductor Manufacturing App 20070129833 - Ho; Yu-Wen ; et al.	2007-06-07
Dispatch integration system and method based on semiconductor manufacturing Grant 7,218,981 - Ho , et al. May 15, 2	2007-05-15
Semiconductor process and yield analysis integrated real-time management method Grant 7,099,729 - Tai , et al. August 29, 2	2006-08-29
Automatic intelligent yield improving and process parameter multivariate system and the analysis method thereof Grant 7,079,677 - Tai , et al. July 18, 2	2006-07-18
Method of Managing Wafer Defects App 20060050950 - Tai; Hung-En ; et al.	2006-03-09
Data Analyzing Method For A Fault Detection And Classification System App 20060048010 - Tai; Hung-En ; et al.	2006-03-02
Method and related system for semiconductor equipment early warning management Grant 6,999,897 - Tai , et al. February 14, 2	2006-02-14
Method for analyzing wafer test parameters Grant 6,968,280 - Tai , et al. November 22, 2	2005-11-22
Method for analyzing in-line QC test parameters Grant 6,959,252 - Tai , et al. October 25, 2	2005-10-25
Method and related system for semiconductor equipment prevention maintenance management Grant 6,950,783 - Tai , et al. September 27, 2	2005-09-27
Method And Related System For Semiconductor Equipment Prevention Maintenance Management App 20050203858 - Tai, Hung-En ; et al.	2005-09-15
Method And Related System For Semiconductor Equipment Early Warning Management App 20050203715 - Tai, Hung-En ; et al.	2005-09-15
Semiconductor Process And Yield Analysis Integrated Real-time Management Method App 20050187648 - Tai, Hung-En ; et al.	2005-08-25
Complex multivariate analysis system and method Grant 6,904,384 - Tai June 7, 2	2005-06-07
Method for analyzing final test parameters Grant 6,898,539 - Tai , et al. May 24, 2	2005-05-24
Method For Analyzing In-line Qc Test Parameters App 20050004773 - Tai, Hung-En ; et al.	2005-01-06
Method for analyzing defect inspection parameters Grant 6,828,776 - Tai , et al. December 7, 2	2004-12-07
Complex Multivariate Analysis System And Method App 20040199358 - Tai, Hung-En	2004-10-07
Method For Analyzing Wafer Test Parameters App 20040193381 - Tai, Hung-En ; et al.	2004-09-30
Method Of Managing Semiconductor Manufacturing Cases App 20040186736 - Tai, Hung-En ; et al.	2004-09-23
Method For Analyzing Final Test Parameters App 20040138856 - Tai, Hung-En ; et al.	2004-07-15
Method For Analyzing Defect Inspection Parameters App 20040124830 - Tai, Hung-En ; et al.	2004-07-01
An Automatic Intelligent Yield Improving And Process Parameter Multivariate System And The Anaysis Method Thereof App 20040001619 - Tai, Hung-En ; et al.	2004-01-01

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