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name:-0.0075380802154541
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Taguchi; Takeyoshi Patent Filings

Taguchi; Takeyoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Taguchi; Takeyoshi.The latest application filed is for "data processing apparatus, method of obtaining characteristic of each pixel and method of data processing, and program".

Company Profile
1.7.6
  • Taguchi; Takeyoshi - Tachikawa JP
  • TAGUCHI; Takeyoshi - Tachikawa-shi Tokyo
  • Taguchi; Takeyoshi - Tokyo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Data processing apparatus, method of obtaining characteristic of each pixel and method of data processing, and program
Grant 10,551,510 - Sakumura , et al. Fe
2020-02-04
Data Processing Apparatus, Method Of Obtaining Characteristic Of Each Pixel And Method Of Data Processing, And Program
App 20180203132 - SAKUMURA; Takuto ;   et al.
2018-07-19
X-ray diffraction apparatus
Grant 7,535,992 - Taguchi , et al. May 19, 2
2009-05-19
X-ray analysis apparatus
Grant 7,209,541 - Taguchi April 24, 2
2007-04-24
X-ray diffraction apparatus
App 20070003012 - Taguchi; Takeyoshi ;   et al.
2007-01-04
X-ray analysis apparatus
Grant 7,145,983 - Taguchi , et al. December 5, 2
2006-12-05
Method for CCD sensor control, CCD sensor system and X-ray diffraction apparatus
App 20050190276 - Taguchi, Takeyoshi
2005-09-01
X-ray analysis apparatus
App 20050084065 - Taguchi, Takeyoshi
2005-04-21
X-ray analysis apparatus
App 20050058247 - Taguchi, Takeyoshi ;   et al.
2005-03-17
Hot cathode of X-ray tube
Grant 6,738,453 - Taguchi , et al. May 18, 2
2004-05-18
Hot cathode of X-ray tube
App 20030053595 - Taguchi, Takeyoshi ;   et al.
2003-03-20
X-ray condenser and x-ray apparatus
Grant 6,529,578 - Taguchi , et al. March 4, 2
2003-03-04
X-ray spectrometer and apparatus for XAFS measurements
Grant 6,456,688 - Taguchi , et al. September 24, 2
2002-09-24

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