loadpatents
name:-0.011938095092773
name:-0.015230894088745
name:-0.002903938293457
Taguchi; Junichi Patent Filings

Taguchi; Junichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Taguchi; Junichi.The latest application filed is for "image processing apparatus, distortion-corrected map creation apparatus, and semiconductor measurement apparatus".

Company Profile
2.11.8
  • Taguchi; Junichi - Sagamihara N/A JP
  • Taguchi; Junichi - Tokyo JP
  • Taguchi; Junichi - Kodama-gun JP
  • Taguchi, Junichi - Sagamihara-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Pattern matching apparatus and computer program
Grant 10,535,129 - Kitazawa , et al. Ja
2020-01-14
Image processing apparatus, distortion-corrected map creation apparatus, and semiconductor measurement apparatus
Grant 9,514,528 - Taguchi , et al. December 6, 2
2016-12-06
Image Processing Apparatus, Distortion-corrected Map Creation Apparatus, And Semiconductor Measurement Apparatus
App 20140341461 - Taguchi; Junichi ;   et al.
2014-11-20
Pattern Matching Apparatus And Computer Program
App 20140023265 - Kitazawa; Masahiro ;   et al.
2014-01-23
Method and apparatus for computing degree of matching
Grant 8,285,056 - Taguchi , et al. October 9, 2
2012-10-09
Defect inspection device and defect inspection method for inspecting whether a product has defects
Grant 8,131,059 - Taguchi , et al. March 6, 2
2012-03-06
Apparatus, method and program product for matching with a template
Grant 8,019,164 - Taguchi , et al. September 13, 2
2011-09-13
Method And Apparatus For Computing Degree Of Matching
App 20090232405 - Taguchi; Junichi ;   et al.
2009-09-17
Defect inspection device and defect inspection method
App 20080310702 - Taguchi; Junichi ;   et al.
2008-12-18
Apparatus, method and program product for matching with a template
App 20080205769 - Taguchi; Junichi ;   et al.
2008-08-28
Inspecting method and apparatus for repeated micro-miniature patterns
Grant 6,944,325 - Taguchi , et al. September 13, 2
2005-09-13
Method and system for embedding information into contents
Grant 6,826,291 - Yoshiura , et al. November 30, 2
2004-11-30
Inspecting method and apparatus for repeated micro-miniature patterns
App 20040047500 - Taguchi, Junichi ;   et al.
2004-03-11
Inspecting method and apparatus for repeated micro-miniature patterns
Grant 6,661,912 - Taguchi , et al. December 9, 2
2003-12-09
Method of authenticating digital-watermark pictures
Grant 6,418,232 - Nakano , et al. July 9, 2
2002-07-09
Method and system for embedding information into contents
App 20020076086 - Yoshiura, Hiroshi ;   et al.
2002-06-20
Flow velocity calculating method in magnetic resonance imaging apparatus
Grant 5,929,637 - Taguchi , et al. July 27, 1
1999-07-27

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