Tachibana; Ichiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for Tachibana; Ichiro.The latest application filed is for "charged particle beam device".
- Tachibana; Ichiro - Tokyo JP
- Tachibana; Ichiro - Hitachinaka N/A JP
| Patent | Date |
|---|---|
| Charged particle beam device Grant 10,971,328 - Kishimoto , et al. April 6, 2 | 2021-04-06 |
| Charged Particle Beam Device App 20200312606 - KISHIMOTO; Takanori ; et al. | 2020-10-01 |
| Charged particle beam device Grant 10,734,191 - Kishimoto , et al. | 2020-08-04 |
| Charged Particle Beam Device App 20180204706 - KISHIMOTO; Takanori ; et al. | 2018-07-19 |
| Charged particle beam device Grant 9,324,540 - Tachibana , et al. April 26, 2 | 2016-04-26 |
| Charged Particle Beam Device App 20150136979 - Tachibana; Ichiro ; et al. | 2015-05-21 |
| Charged particle radiation device Grant 8,729,467 - Tsuji , et al. May 20, 2 | 2014-05-20 |
| Charged particle radiation device Grant 8,629,410 - Tsuji , et al. January 14, 2 | 2014-01-14 |
| Electron beam apparatus and electron beam inspection method Grant 8,431,893 - Fukuda , et al. April 30, 2 | 2013-04-30 |
| Electron Beam Apparatus and Electron Beam Inspection Method App 20120261574 - Fukuda; Muneyuki ; et al. | 2012-10-18 |
| Charged Particle Radiation Device App 20120193550 - Tsuji; Hiroshi ; et al. | 2012-08-02 |
| Scanning electron microscope and method of imaging an object by using the scanning electron microscope Grant 8,222,601 - Tachibana , et al. July 17, 2 | 2012-07-17 |
| Electron beam apparatus and electron beam inspection method Grant 8,207,498 - Fukuda , et al. June 26, 2 | 2012-06-26 |
| Charged Particle Radiation Device App 20120091362 - Tsuji; Hiroshi ; et al. | 2012-04-19 |
| Electron Beam Apparatus And Electron Beam Inspection Method App 20110101223 - Fukuda; Muneyuki ; et al. | 2011-05-05 |
| Scanning Electron Microscope And Method Of Imaging An Object By Using The Scanning Electron Microscope App 20110095184 - TACHIBANA; Ichiro ; et al. | 2011-04-28 |
| Scanning electron microscope and method of imaging an object by using the scanning electron microscope Grant 7,888,640 - Tachibana , et al. February 15, 2 | 2011-02-15 |
| Electron beam apparatus and electron beam inspection method Grant 7,875,849 - Fukuda , et al. January 25, 2 | 2011-01-25 |
| Scanning electron microscope Grant 7,619,219 - Suzuki , et al. November 17, 2 | 2009-11-17 |
| Scanning electron microscope and apparatus for detecting defect Grant 7,504,626 - Tachibana , et al. March 17, 2 | 2009-03-17 |
| Scanning Electron Microscope And Method Of Imaging An Object By Using The Scanning Electron Microscope App 20080310704 - TACHIBANA; Ichiro ; et al. | 2008-12-18 |
| Scanning Electron Microscope App 20080135755 - SUZUKI; Naomasa ; et al. | 2008-06-12 |
| Electron Beam Apparatus and Electron Beam Inspection Method App 20080099673 - Fukuda; Muneyuki ; et al. | 2008-05-01 |
| Scanning electron microscope and apparatus for detecting defect App 20070187598 - Tachibana; Ichiro ; et al. | 2007-08-16 |
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