TABERY; Cyrus Emil

Patent Applications and Registrations

Patent applications and USPTO patent grants for TABERY; Cyrus Emil.The latest application filed is for "method for controlling a manufacturing process and associated apparatuses".

Company Profile

2.2.8

TABERY; Cyrus Emil - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method For Controlling A Manufacturing Process And Associated Apparatuses App 20220026810 - BRANTJES; Nicolaas Petrus Marcus ; et al.	2022-01-27
Method To Predict Yield Of A Device Manufacturing Process App 20220011728 - ZHANG; Youping ; et al.	2022-01-13
Method Of Manufacturing Devices App 20210397172 - SLACHTER; Abraham ; et al.	2021-12-23
Method For Determining Root Cause Affecting Yield In A Semiconductor Manufacturing Process App 20210389677 - LIN; Chenxi ; et al.	2021-12-16
Method for determining a control parameter for an apparatus utilized in a semiconductor manufacturing process Grant 11,181,829 - Tabery , et al. November 23, 2	2021-11-23
Method To Predict Yield Of A Device Manufacturing Process App 20210325788 - YPMA; Alexander ; et al.	2021-10-21
Method to predict yield of a device manufacturing process Grant 11,086,229 - Ypma , et al. August 10, 2	2021-08-10
Method For Determining A Control Parameter For An Apparatus Utilized In A Semiconductor Manufacturing Process App 20210132508 - TABERY; Cyrus Emil ; et al.	2021-05-06
Voltage Contrast Metrology Mark App 20210088917 - TABERY; Cyrus Emil ; et al.	2021-03-25
Method To Predict Yield Of A Device Manufacturing Process App 20200103761 - YPMA; Alexander ; et al.	2020-04-02

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