Tabakman; Keith

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tabakman; Keith.The latest application filed is for "source/drain contact depth control".

Company Profile

8.11.9

Tabakman; Keith - Wilton NY
Tabakman; Keith - Gansevoort NY
Tabakman; Keith - Newburgh NY
Tabakman; Keith - Fishkill NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Source/drain contact depth control Grant 10,991,796 - Hu , et al. April 27, 2	2021-04-27
Middle of line structures Grant 10,978,566 - Zang , et al. April 13, 2	2021-04-13
FinFET with high-k spacer and self-aligned contact capping layer Grant 10,734,233 - Zang , et al.	2020-08-04
Source/drain Contact Depth Control App 20200203480 - HU; Lin ; et al.	2020-06-25
Middle Of Line Structures App 20200152749 - ZANG; Hui ; et al.	2020-05-14
Middle of line structures Grant 10,580,875 - Zang , et al.	2020-03-03
Finfet With High-k Spacer And Self-aligned Contact Capping Layer App 20190259619 - Zang; Hui ; et al.	2019-08-22
Middle Of Line Structures App 20190221650 - ZANG; Hui ; et al.	2019-07-18
Methods of forming a gate structure-to-source/drain conductive contact and the resulting devices Grant 10,297,504 - Zang , et al.	2019-05-21
Methods Of Forming A Gate Structure-to-source/drain Conductive Contact And The Resulting Devices App 20190043758 - Zang; Hui ; et al.	2019-02-07
Semiconductor devices with robust low-k sidewall spacers and method for producing the same Grant 10,192,791 - Gu , et al. Ja	2019-01-29
Methods of forming MIS contact structures on transistor devices Grant 9,831,123 - Patil , et al. November 28, 2	2017-11-28
Methods Of Forming Mis Contact Structures On Transistor Devices App 20170287777 - Patil; Suraj K. ; et al.	2017-10-05
Methods of forming MIS contact structures on transistor devices in CMOS applications Grant 9,613,855 - Patil , et al. April 4, 2	2017-04-04
Forming fins of different semiconductor materials on the same substrate Grant 9,536,900 - Ramachandran , et al. January 3, 2	2017-01-03
Forming Fins Of Different Semiconductor Materials On The Same Substrate App 20150340381 - Ramachandran; Ravikumar ; et al.	2015-11-26
Method of performing measurement sampling of lots in a manufacturing process Grant 7,895,008 - Behm , et al. February 22, 2	2011-02-22
Method and system of data weighted object orientation for data mining Grant 7,751,920 - Moyer , et al. July 6, 2	2010-07-06
Method Of Performing Measurement Sampling Of Lots In A Manufacturing Process App 20090234485 - Behm; Gary W. ; et al.	2009-09-17
Method And System Of Data Weighted Object Orientation For Data Mining App 20080140247 - Moyer; Thomas P. ; et al.	2008-06-12

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