Patent | Date |
---|
Enhanced intermetal dielectric adhesion Grant 11,282,744 - Uttwani , et al. March 22, 2 | 2022-03-22 |
Optimum layout of dies on a wafer Grant 11,163,238 - Tee , et al. November 2, 2 | 2021-11-02 |
Optimum Layout Of Dies On A Wafer App 20210103223 - TEE; Seng Jian ;   et al. | 2021-04-08 |
Chemical Mechanical Polishing (cmp) Polishing Head With Improved Vacuum Sealing App 20210094146 - PACHAIYAPPAN; Jayakumar ;   et al. | 2021-04-01 |
Enhanced Intermetal Dielectric Adhesion App 20210098289 - UTTWANI; Pankaj Kumar ;   et al. | 2021-04-01 |
Non-volatile memory cell structure and a method of fabricating the same Grant 8,629,032 - Huang January 14, 2 | 2014-01-14 |
EEPROM cell structure and a method of fabricating the same Grant 8,564,043 - Huang , et al. October 22, 2 | 2013-10-22 |
Metal-insulator-metal Capacitor And A Method Of Fabricating The Same App 20120211866 - Chao; Chung-Wen | 2012-08-23 |
Non-volatile Memory Cell Structure And A Method Of Fabricating The Same App 20120181595 - HUANG; Sheng He | 2012-07-19 |
Eeprom Cell Structure And A Method Of Fabricating The Same App 20120181594 - HUANG; Sheng He ;   et al. | 2012-07-19 |
Metal-insulator-metal Capacitor And Method For Fabricating Metal-insulator-metal Capacitor Structures App 20110278697 - Tan; Poh Cheng ;   et al. | 2011-11-17 |
System and method for measuring tool performance Grant 7,778,798 - Ang , et al. August 17, 2 | 2010-08-17 |
Metal comb structures, methods for their fabrication and failure analysis Grant 7,772,590 - Kuan August 10, 2 | 2010-08-10 |
Method and system for determining a predicted flash endurance Vt of a flash cell after N program/erase cycles Grant 7,693,667 - Foo April 6, 2 | 2010-04-06 |
Sensing system Grant 7,663,743 - Garcia February 16, 2 | 2010-02-16 |
Probe card needle cleaning frequency optimization Grant 7,642,798 - Tan January 5, 2 | 2010-01-05 |
Method For Fabrication Of Single Electron Transistors App 20090146222 - AGRAWAL; Naveen | 2009-06-11 |
Metal Comb Structures, Methods For Their Fabrication And Failure Analysis App 20080218749 - Kuan; Hing Poh | 2008-09-11 |
System and method for detection of spatial signature yield loss Grant 7,400,391 - Ho July 15, 2 | 2008-07-15 |
Method of electro migration testing Grant 7,394,280 - Low , et al. July 1, 2 | 2008-07-01 |
METHOD AND SYSTEM FOR DETERMINING A PREDICTED FLASH ENDURANCE Vt OF A FLASH CELL AFTER N PROGRAM/ERASE CYCLES App 20080126000 - FOO; Eu Gene Glen | 2008-05-29 |
System And Method For Measuring Tool Performance App 20080091382 - Ang; Swee Keng ;   et al. | 2008-04-17 |
Delineation of wafers Grant 7,355,173 - Kuan April 8, 2 | 2008-04-08 |
Analyzer magnet chamber liner Grant 7,351,990 - Cao , et al. April 1, 2 | 2008-04-01 |
TEM sample preparation from a circuit layer structure Grant 7,317,188 - Zhang , et al. January 8, 2 | 2008-01-08 |
Cmp Slurry Strainer App 20070262030 - Meng Fei; Koh ;   et al. | 2007-11-15 |
Apparatus For Thermocouple Setting And Flat Zone Procedure In A Furnace App 20070258505 - Jindal; Sanjeev ;   et al. | 2007-11-08 |
Curve tracing device and method Grant 7,272,760 - Tan , et al. September 18, 2 | 2007-09-18 |
Polishing head elbow fitting Grant 7,247,084 - Koh , et al. July 24, 2 | 2007-07-24 |
System and Method for Detection of Spatial Signature Yield Loss App 20070161132 - HO; Eng Keong | 2007-07-12 |
Method for detecting and monitoring wafer probing process instability Grant 7,230,439 - Tan June 12, 2 | 2007-06-12 |
Selective reactive ion etching of wafers App 20070095786 - Ye; Sim Kwang ;   et al. | 2007-05-03 |
System and method for detection of spatial signature yield loss Grant 7,211,450 - Ho May 1, 2 | 2007-05-01 |
Planar view TEM sample preparation from circuit layer structures Grant 7,208,965 - Zhang , et al. April 24, 2 | 2007-04-24 |
Fabrication of local interconnect lines Grant 7,208,363 - Dufrenne , et al. April 24, 2 | 2007-04-24 |
Process for producing improved membranes Grant 7,201,642 - Koh , et al. April 10, 2 | 2007-04-10 |
Titanium underlayer for lines in semiconductor devices Grant 7,179,743 - Ng , et al. February 20, 2 | 2007-02-20 |
Method of etching a semiconductor device Grant 7,144,749 - Ng , et al. December 5, 2 | 2006-12-05 |
Capacity management in a wafer fabrication plant Grant 7,142,937 - Chin , et al. November 28, 2 | 2006-11-28 |
Capacity Management In A Wafer Fabrication Plant App 20060259173 - Chin; Chen Chong ;   et al. | 2006-11-16 |
TEM sample preparation from a circuit layer structure App 20060243919 - Zhang; Wen Yi ;   et al. | 2006-11-02 |
Method for detecting and monitoring wafer probing process instability App 20060149505 - Tan; Ben Ghee | 2006-07-06 |
Printed circuit board for burn-in testing App 20060125504 - Tan; Kok Tong ;   et al. | 2006-06-15 |
Titanium underlayer for lines in semiconductor devices App 20050116350 - Ng, Khim Hong ;   et al. | 2005-06-02 |