Systems On Silicon Manufacturing Co. Pte. Ltd.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Systems On Silicon Manufacturing Co. Pte. Ltd..The latest application filed is for "optimum layout of dies on a wafer".

Company Profile

3.26.20

Systems On Silicon Manufacturing Co. Pte. Ltd. - Singapore SG
SYSTEMS ON SILICON MANUFACTURING CO. PTE. LTD. -
Systems on Silicon Manufacturing Co. Pte. Ltd. - 70 Pasir Ris Industrial Drive 1 Singapore SG

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Enhanced intermetal dielectric adhesion Grant 11,282,744 - Uttwani , et al. March 22, 2	2022-03-22
Optimum layout of dies on a wafer Grant 11,163,238 - Tee , et al. November 2, 2	2021-11-02
Optimum Layout Of Dies On A Wafer App 20210103223 - TEE; Seng Jian ; et al.	2021-04-08
Chemical Mechanical Polishing (cmp) Polishing Head With Improved Vacuum Sealing App 20210094146 - PACHAIYAPPAN; Jayakumar ; et al.	2021-04-01
Enhanced Intermetal Dielectric Adhesion App 20210098289 - UTTWANI; Pankaj Kumar ; et al.	2021-04-01
Non-volatile memory cell structure and a method of fabricating the same Grant 8,629,032 - Huang January 14, 2	2014-01-14
EEPROM cell structure and a method of fabricating the same Grant 8,564,043 - Huang , et al. October 22, 2	2013-10-22
Metal-insulator-metal Capacitor And A Method Of Fabricating The Same App 20120211866 - Chao; Chung-Wen	2012-08-23
Non-volatile Memory Cell Structure And A Method Of Fabricating The Same App 20120181595 - HUANG; Sheng He	2012-07-19
Eeprom Cell Structure And A Method Of Fabricating The Same App 20120181594 - HUANG; Sheng He ; et al.	2012-07-19
Metal-insulator-metal Capacitor And Method For Fabricating Metal-insulator-metal Capacitor Structures App 20110278697 - Tan; Poh Cheng ; et al.	2011-11-17
System and method for measuring tool performance Grant 7,778,798 - Ang , et al. August 17, 2	2010-08-17
Metal comb structures, methods for their fabrication and failure analysis Grant 7,772,590 - Kuan August 10, 2	2010-08-10
Method and system for determining a predicted flash endurance Vt of a flash cell after N program/erase cycles Grant 7,693,667 - Foo April 6, 2	2010-04-06
Sensing system Grant 7,663,743 - Garcia February 16, 2	2010-02-16
Probe card needle cleaning frequency optimization Grant 7,642,798 - Tan January 5, 2	2010-01-05
Method For Fabrication Of Single Electron Transistors App 20090146222 - AGRAWAL; Naveen	2009-06-11
Metal Comb Structures, Methods For Their Fabrication And Failure Analysis App 20080218749 - Kuan; Hing Poh	2008-09-11
System and method for detection of spatial signature yield loss Grant 7,400,391 - Ho July 15, 2	2008-07-15
Method of electro migration testing Grant 7,394,280 - Low , et al. July 1, 2	2008-07-01
METHOD AND SYSTEM FOR DETERMINING A PREDICTED FLASH ENDURANCE Vt OF A FLASH CELL AFTER N PROGRAM/ERASE CYCLES App 20080126000 - FOO; Eu Gene Glen	2008-05-29
System And Method For Measuring Tool Performance App 20080091382 - Ang; Swee Keng ; et al.	2008-04-17
Delineation of wafers Grant 7,355,173 - Kuan April 8, 2	2008-04-08
Analyzer magnet chamber liner Grant 7,351,990 - Cao , et al. April 1, 2	2008-04-01
TEM sample preparation from a circuit layer structure Grant 7,317,188 - Zhang , et al. January 8, 2	2008-01-08
Cmp Slurry Strainer App 20070262030 - Meng Fei; Koh ; et al.	2007-11-15
Apparatus For Thermocouple Setting And Flat Zone Procedure In A Furnace App 20070258505 - Jindal; Sanjeev ; et al.	2007-11-08
Curve tracing device and method Grant 7,272,760 - Tan , et al. September 18, 2	2007-09-18
Polishing head elbow fitting Grant 7,247,084 - Koh , et al. July 24, 2	2007-07-24
System and Method for Detection of Spatial Signature Yield Loss App 20070161132 - HO; Eng Keong	2007-07-12
Method for detecting and monitoring wafer probing process instability Grant 7,230,439 - Tan June 12, 2	2007-06-12
Selective reactive ion etching of wafers App 20070095786 - Ye; Sim Kwang ; et al.	2007-05-03
System and method for detection of spatial signature yield loss Grant 7,211,450 - Ho May 1, 2	2007-05-01
Planar view TEM sample preparation from circuit layer structures Grant 7,208,965 - Zhang , et al. April 24, 2	2007-04-24
Fabrication of local interconnect lines Grant 7,208,363 - Dufrenne , et al. April 24, 2	2007-04-24
Process for producing improved membranes Grant 7,201,642 - Koh , et al. April 10, 2	2007-04-10
Titanium underlayer for lines in semiconductor devices Grant 7,179,743 - Ng , et al. February 20, 2	2007-02-20
Method of etching a semiconductor device Grant 7,144,749 - Ng , et al. December 5, 2	2006-12-05
Capacity management in a wafer fabrication plant Grant 7,142,937 - Chin , et al. November 28, 2	2006-11-28
Capacity Management In A Wafer Fabrication Plant App 20060259173 - Chin; Chen Chong ; et al.	2006-11-16
TEM sample preparation from a circuit layer structure App 20060243919 - Zhang; Wen Yi ; et al.	2006-11-02
Method for detecting and monitoring wafer probing process instability App 20060149505 - Tan; Ben Ghee	2006-07-06
Printed circuit board for burn-in testing App 20060125504 - Tan; Kok Tong ; et al.	2006-06-15
Titanium underlayer for lines in semiconductor devices App 20050116350 - Ng, Khim Hong ; et al.	2005-06-02

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