name:-0.2059588432312
name:-0.0052599906921387
name:-0.0053191184997559
SYSTEM SQUARE INC. Patent Filings

SYSTEM SQUARE INC.

Patent Applications and Registrations

Patent applications and USPTO patent grants for SYSTEM SQUARE INC..The latest application filed is for "training data generation device and training data generation program".

Company Profile
5.8.8
  • SYSTEM SQUARE INC. - Nagaoka-shi, Niigata JP
  • System Square Inc. - Niigata N/A JP
  • SYSTEM SQUARE INC. - Nagaoka-Shi JP
  • System Square Inc. -
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks
Patent Activity
PatentDate
Training Data Generation Device And Training Data Generation Program
App 20220067434 - NAKAGAWA; Sachihiro
2022-03-03
X-ray inspection apparatus
Grant 10,859,516 - Ikeda , et al. December 8, 2
2020-12-08
Electromagnetic wave detection module, electromagnetic wave detection module array, and non-destructive inspection apparatus
App 20200241150 - IKEDA; Noriaki ;   et al.
2020-07-30
X-ray Inspection Apparatus
App 20190212464 - IKEDA; Noriaki ;   et al.
2019-07-11
X-ray inspection system
Grant 9,865,424 - Ikeda , et al. January 9, 2
2018-01-09
Package inspection system
Grant 9,733,384 - Suzuki , et al. August 15, 2
2017-08-15
Package inspection system
Grant 9,541,499 - Ikeda January 10, 2
2017-01-10
Package Inspection System
App 20160033404 - Suzuki; Atsushi ;   et al.
2016-02-04
Package Inspection System
App 20150241341 - IKEDA; Noriaki
2015-08-27
X-ray Inspection System
App 20150179391 - IKEDA; Noriaki ;   et al.
2015-06-25
Package Inspection Apparatus
App 20120327227 - IKEDA; Noriaki ;   et al.
2012-12-27

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