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name:-0.0059659481048584
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SUZUKI; Katsumasa Patent Filings

SUZUKI; Katsumasa

Patent Applications and Registrations

Patent applications and USPTO patent grants for SUZUKI; Katsumasa.The latest application filed is for "method for detecting presence of liquid material".

Company Profile
0.5.7
  • SUZUKI; Katsumasa - Tsukuba-shi JP
  • Suzuki; Katsumasa - Tokyo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method For Detecting Presence Of Liquid Material
App 20130340506 - SUZUKI; Katsumasa
2013-12-26
Granular material comprising porous particles containing calcium and/or magnesium
Grant 7,976,806 - Misumi , et al. July 12, 2
2011-07-12
Porous Calcium Oxide Particulate And Porous Calcium Hydroxide Particulate
App 20090246524 - Ohmi; Tadahiro ;   et al.
2009-10-01
Granular Material Comprising Porous Particles Containing Calcium And/or Magnesium
App 20090215616 - Misumi; Osamu ;   et al.
2009-08-27
Exhaust Gas Treatment System
App 20090047187 - Suzuki; Katsumasa ;   et al.
2009-02-19
Method for treating exhaust gas and apparatus for treating exhaust gas
App 20070160512 - Ohmi; Tadahiro ;   et al.
2007-07-12
Exhaust gas treatment agent, exhaust gas treatment method and exhaust gas treatment device
App 20070154372 - Hasegawa; Hideharu ;   et al.
2007-07-05
Method of purging CVD apparatus and method for judging maintenance of times of semiconductor production apparatuses
Grant 6,887,721 - Hasegawa , et al. May 3, 2
2005-05-03
Spectroscopic method for analyzing isotopes by using a semiconductor laser
Grant 6,800,855 - Dong , et al. October 5, 2
2004-10-05
Spectroscopic method for analyzing a gas by using laser beam
Grant 6,636,316 - Matsumoto , et al. October 21, 2
2003-10-21
Laser spectroscopy system
Grant 6,483,589 - Suzuki , et al. November 19, 2
2002-11-19
Method of purging CVD apparatus and method for judging maintenance of times of semiconductor production apparatuses
App 20020061605 - Hasegawa, Hiroyuki ;   et al.
2002-05-23

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