Patent | Date |
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Method and apparatus for bond wire testing in an integrated circuit Grant 10,955,465 - Suto , et al. March 23, 2 | 2021-03-23 |
Identifying potentially-defective picture elements in an active-matrix display panel Grant 10,615,230 - Messier , et al. | 2020-04-07 |
Method And Apparatus For Bond Wire Testing In An Integrated Circuit App 20200088785 - Suto; Anthony J. ;   et al. | 2020-03-19 |
Identifying Potentially-defective Picture Elements In An Active-matrix Display Panel App 20190140032 - Messier; Jason A. ;   et al. | 2019-05-09 |
Test fixture Grant 9,977,052 - Suto , et al. May 22, 2 | 2018-05-22 |
Test Fixture App 20180095109 - Suto; Anthony J. ;   et al. | 2018-04-05 |
Vibration Testing Tool App 20170292873 - Schleicher; Robert M. ;   et al. | 2017-10-12 |
Capacitive opens testing of low profile components Grant 9,778,314 - Suto October 3, 2 | 2017-10-03 |
Method and apparatus for testing electrical connections on a printed circuit board Grant 9,638,742 - Suto May 2, 2 | 2017-05-02 |
Electronic assembly test system Grant 9,459,312 - Arena , et al. October 4, 2 | 2016-10-04 |
Capacitive Opens Testing Of Low Profile Components App 20160054385 - Suto; Anthony J. | 2016-02-25 |
Electronic Assembly Test System App 20140306728 - Arena; John Joseph ;   et al. | 2014-10-16 |
Low capacitance probe for testing circuit assembly Grant 8,760,185 - Suto June 24, 2 | 2014-06-24 |
Fast open circuit detection for open power and ground pins Grant 8,760,183 - Suto June 24, 2 | 2014-06-24 |
Identifying fuel cell defects Grant 08618810 - | 2013-12-31 |
Identifying fuel cell defects Grant 8,618,810 - Suto , et al. December 31, 2 | 2013-12-31 |
Test access component for automatic testing of circuit assemblies Grant 8,604,820 - Suto December 10, 2 | 2013-12-10 |
Capacitive opens testing in low signal environments Grant 8,310,256 - Suto November 13, 2 | 2012-11-13 |
Identifying Fuel Cell Defects App 20120225366 - Suto; Anthony J. ;   et al. | 2012-09-06 |
Fast Open Circuit Detection For Open Power And Ground Pins App 20110210759 - Suto; Anthony J. | 2011-09-01 |
Method And Apparatus For Testing Electrical Connections On A Printed Circuit Board App 20110204910 - Suto; Anthony J. | 2011-08-25 |
Capacitive Opens Testing In Low Signal Environments App 20110148446 - Suto; Anthony J. | 2011-06-23 |
Low Capacitance Probe For Testing Circuit Assembly App 20110148450 - Suto; Anthony J. | 2011-06-23 |
Test Access Component For Automatic Testing Of Circuit Assemblies App 20100207651 - Suto; Anthony J. | 2010-08-19 |
Circuit-board tester with backdrive-based burst timing Grant 6,175,230 - Hamblin , et al. January 16, 2 | 2001-01-16 |
Current probe signal processing circuit employing sample and hold technique to locate circuit faults Grant 4,517,511 - Suto May 14, 1 | 1985-05-14 |