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name:-0.015531063079834
name:-0.017539024353027
name:-0.0045599937438965
Suto; Anthony J. Patent Filings

Suto; Anthony J.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Suto; Anthony J..The latest application filed is for "method and apparatus for bond wire testing in an integrated circuit".

Company Profile
5.18.12
  • Suto; Anthony J. - Sterling MA
  • - Sterling MA US
  • Suto; Anthony J. - Clifton Park NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method and apparatus for bond wire testing in an integrated circuit
Grant 10,955,465 - Suto , et al. March 23, 2
2021-03-23
Identifying potentially-defective picture elements in an active-matrix display panel
Grant 10,615,230 - Messier , et al.
2020-04-07
Method And Apparatus For Bond Wire Testing In An Integrated Circuit
App 20200088785 - Suto; Anthony J. ;   et al.
2020-03-19
Identifying Potentially-defective Picture Elements In An Active-matrix Display Panel
App 20190140032 - Messier; Jason A. ;   et al.
2019-05-09
Test fixture
Grant 9,977,052 - Suto , et al. May 22, 2
2018-05-22
Test Fixture
App 20180095109 - Suto; Anthony J. ;   et al.
2018-04-05
Vibration Testing Tool
App 20170292873 - Schleicher; Robert M. ;   et al.
2017-10-12
Capacitive opens testing of low profile components
Grant 9,778,314 - Suto October 3, 2
2017-10-03
Method and apparatus for testing electrical connections on a printed circuit board
Grant 9,638,742 - Suto May 2, 2
2017-05-02
Electronic assembly test system
Grant 9,459,312 - Arena , et al. October 4, 2
2016-10-04
Capacitive Opens Testing Of Low Profile Components
App 20160054385 - Suto; Anthony J.
2016-02-25
Electronic Assembly Test System
App 20140306728 - Arena; John Joseph ;   et al.
2014-10-16
Low capacitance probe for testing circuit assembly
Grant 8,760,185 - Suto June 24, 2
2014-06-24
Fast open circuit detection for open power and ground pins
Grant 8,760,183 - Suto June 24, 2
2014-06-24
Identifying fuel cell defects
Grant 08618810 -
2013-12-31
Identifying fuel cell defects
Grant 8,618,810 - Suto , et al. December 31, 2
2013-12-31
Test access component for automatic testing of circuit assemblies
Grant 8,604,820 - Suto December 10, 2
2013-12-10
Capacitive opens testing in low signal environments
Grant 8,310,256 - Suto November 13, 2
2012-11-13
Identifying Fuel Cell Defects
App 20120225366 - Suto; Anthony J. ;   et al.
2012-09-06
Fast Open Circuit Detection For Open Power And Ground Pins
App 20110210759 - Suto; Anthony J.
2011-09-01
Method And Apparatus For Testing Electrical Connections On A Printed Circuit Board
App 20110204910 - Suto; Anthony J.
2011-08-25
Capacitive Opens Testing In Low Signal Environments
App 20110148446 - Suto; Anthony J.
2011-06-23
Low Capacitance Probe For Testing Circuit Assembly
App 20110148450 - Suto; Anthony J.
2011-06-23
Test Access Component For Automatic Testing Of Circuit Assemblies
App 20100207651 - Suto; Anthony J.
2010-08-19
Circuit-board tester with backdrive-based burst timing
Grant 6,175,230 - Hamblin , et al. January 16, 2
2001-01-16
Current probe signal processing circuit employing sample and hold technique to locate circuit faults
Grant 4,517,511 - Suto May 14, 1
1985-05-14

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