Sutherland; Orson

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sutherland; Orson.The latest application filed is for "magnetically enhanced, inductively coupled plasma source for a focused ion beam system".

Company Profile

0.10.8

Sutherland; Orson - Leiden NL
Sutherland; Orson - Evatt N/A AU
Sutherland; Orson - Australian Capital Territory AU

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Plasma source for a focused ion beam system Grant 9,640,367 - Keller , et al. May 2, 2	2017-05-02
Magnetically Enhanced, Inductively coupled Plasma Source For a Focused Ion Beam System App 20150130348 - Keller; John ; et al.	2015-05-14
Magnetically enhanced, inductively coupled plasma source for a focused ion beam system Grant 8,829,468 - Keller , et al. September 9, 2	2014-09-09
Charged particle extraction device and method of design there for Grant 8,653,474 - Boswell , et al. February 18, 2	2014-02-18
Charged Particle Extraction Device and Method of Design There for App 20130240751 - Boswell; Roderick ; et al.	2013-09-19
Charged particle extraction device and method of design there for Grant 8,405,043 - Boswell , et al. March 26, 2	2013-03-26
Magnetically Enhanced, Inductively Coupled Plasma Source For A Focused Ion Beam System App 20120319000 - Keller; John ; et al.	2012-12-20
Magnetically enhanced, inductively coupled plasma source for a focused ion beam system Grant 8,168,957 - Keller , et al. May 1, 2	2012-05-01
Charged Particle Extraction Device And Method Of Design There for App 20110100798 - Boswell; Roderick ; et al.	2011-05-05
Charged particle extraction device and method of design there for Grant 7,872,242 - Boswell , et al. January 18, 2	2011-01-18
Magnetically Enhanced, Inductively Coupled Plasma Source for a Focused Ion Beam System App 20100294648 - Keller; John ; et al.	2010-11-25
Magnetically enhanced, inductively coupled plasma source for a focused ion beam system Grant 7,670,455 - Keller , et al. March 2, 2	2010-03-02
Charged Particle Extraction Device and Method of Design There For App 20100044580 - Boswell; Roderick ; et al.	2010-02-25
Magnetically enhanced, inductively coupled plasma source for a focused ion beam system App 20080017319 - Keller; John ; et al.	2008-01-24
Magnetically enhanced, inductively coupled plasma source for a focused ion beam system Grant 7,241,361 - Keller , et al. July 10, 2	2007-07-10
Magnetically enhanced, inductively coupled plasma source for a focused ion beam system App 20050183667 - Keller, John ; et al.	2005-08-25

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