Sutani; Takumichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sutani; Takumichi.The latest application filed is for "image processor, method for generating pattern using self-organizing lithographic techniques and computer program".

Company Profile

1.35.31

Sutani; Takumichi - Tokyo JP
Sutani; Takumichi - Hitachinaka N/A JP
Sutani; Takumichi - Hitachinaka-shi JP
Sutani; Takumichi - Yokohama JP
Sutani, Takumichi - Yokohama-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Image processor, method for generating pattern using self-organizing lithographic techniques and computer program Grant 10,732,512 - Sutani , et al.	2020-08-04
Image Processor, Method for Generating Pattern Using Self-Organizing Lithographic Techniques and Computer Program App 20180181009 - SUTANI; Takumichi ; et al.	2018-06-28
Image Processor, Method For Generating Pattern Using Self- Organizing Lithographic Techniques And Computer Program App 20150277237 - Sutani; Takumichi ; et al.	2015-10-01
Method and apparatus for creating imaging recipe Grant RE45,224 - Miyamoto , et al. October 28, 2	2014-10-28
Method and apparatus for creating imaging recipe Grant RE45,204 - Miyamoto , et al. October 21, 2	2014-10-21
Method of OPC model building, information-processing apparatus, and method of determining process conditions of semiconductor device Grant 8,788,981 - Kijima , et al. July 22, 2	2014-07-22
Method and apparatus of pattern inspection and semiconductor inspection system using the same Grant 8,577,124 - Toyoda , et al. November 5, 2	2013-11-05
Pattern measuring method and pattern measuring device Grant 8,507,856 - Sutani , et al. August 13, 2	2013-08-13
Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatus Grant 8,338,804 - Morokuma , et al. December 25, 2	2012-12-25
Method and apparatus for inspecting defect of pattern formed on semiconductor device Grant 8,331,651 - Nishiura , et al. December 11, 2	2012-12-11
Pattern Measuring Method And Pattern Measuring Device App 20120211653 - SUTANI; Takumichi ; et al.	2012-08-23
Pattern matching method and computer program for executing pattern matching Grant 8,244,042 - Sugiyama , et al. August 14, 2	2012-08-14
Electron microscope for inspecting dimension and shape of a pattern formed on a wafer Grant 8,199,191 - Sato , et al. June 12, 2	2012-06-12
Pattern displacement measuring method and pattern measuring device Grant 8,173,962 - Sutani , et al. May 8, 2	2012-05-08
Method And Apparatus Of Pattern Inspection And Semiconductor Inspection System Using The Same App 20120099781 - TOYODA; Yasutaka ; et al.	2012-04-26
Defect inspection device and defect inspection method for inspecting whether a product has defects Grant 8,131,059 - Taguchi , et al. March 6, 2	2012-03-06
Method and apparatus of pattern inspection and semiconductor inspection system using the same Grant 8,115,169 - Toyoda , et al. February 14, 2	2012-02-14
Method and Apparatus For Inspecting Defect Of Pattern Formed On Semiconductor Device App 20120002861 - Nishiura; Tomofumi ; et al.	2012-01-05
Method and apparatus for inspecting defect of pattern formed on semiconductor device Grant 8,045,789 - Nishiura , et al. October 25, 2	2011-10-25
Method, device and computer program of length measurement Grant 8,019,161 - Morokuma , et al. September 13, 2	2011-09-13
Pattern matching apparatus and semiconductor inspection system using the same Grant 7,991,218 - Toyoda , et al. August 2, 2	2011-08-02
Pattern inspection apparatus and semiconductor inspection system Grant 7,978,904 - Toyoda , et al. July 12, 2	2011-07-12
Sample Dimension Inspecting/measuring Method And Sample Dimension Inspecting/measuring Apparatus App 20110158543 - Morokuma; Hidetoshi ; et al.	2011-06-30
Pattern Matching Method And Computer Program For Executing Pattern Matching App 20110150345 - SUGIYAMA; Akiyuki ; et al.	2011-06-23
Pattern matching method and computer program for executing pattern matching Grant 7,925,095 - Sugiyama , et al. April 12, 2	2011-04-12
Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatus Grant 7,923,703 - Morokuma , et al. April 12, 2	2011-04-12
Pattern matching method and pattern matching program Grant 7,889,909 - Shindo , et al. February 15, 2	2011-02-15
Pattern measurement method and pattern measurement system Grant 7,800,060 - Sato , et al. September 21, 2	2010-09-21
Pattern Displacement Measuring Method And Pattern Measuring Device App 20100140472 - SUTANI; Takumichi ; et al.	2010-06-10
System and Method for Detecting a Defect App 20100138801 - MATSUOKA; Ryoichi ; et al.	2010-06-03
Pattern displacement measuring method and pattern measuring device Grant 7,679,055 - Sutani , et al. March 16, 2	2010-03-16
System and method for detecting defects in a semiconductor during manufacturing thereof Grant 7,681,159 - Matsuoka , et al. March 16, 2	2010-03-16
Sample Dimension Inspecting/measuring Method And Sample Dimension Inspecting/measuring Apparatus App 20090218491 - Morokuma; Hidetoshi ; et al.	2009-09-03
Method And Apparatus For Inspecting Defect Of Pattern Formed On Semiconductor Device App 20090208090 - NISHIURA; Tomofumi ; et al.	2009-08-20
Pattern Measuring Method And Pattern Measuring Device App 20090200465 - SUTANI; Takumichi ; et al.	2009-08-13
Method and apparatus for creating imaging recipe Grant 7,559,047 - Miyamoto , et al. July 7, 2	2009-07-07
Method And Apparatus Of Pattern Inspection And Semiconductor Inspection System Using The Same App 20090152463 - TOYODA; Yasutaka ; et al.	2009-06-18
Pattern measuring method and pattern measuring device Grant 7,518,110 - Sutani , et al. April 14, 2	2009-04-14
Method and apparatus of pattern inspection and semiconductor inspection system using the same Grant 7,507,961 - Toyoda , et al. March 24, 2	2009-03-24
Pattern Measurement Method And Pattern Measurement System App 20090032707 - SATO; Hidetoshi ; et al.	2009-02-05
Defect inspection device and defect inspection method App 20080310702 - Taguchi; Junichi ; et al.	2008-12-18
Dimension measuring SEM system, method of evaluating shape of circuit pattern and a system for carrying out the method Grant 7,449,689 - Nagatomo , et al. November 11, 2	2008-11-11
Method of OPC Model Building, Information-Processing Apparatus, and Method of Determining Process Conditions of Semiconductor Device App 20080250380 - Kijima; Mihoko ; et al.	2008-10-09
Pattern displacement measuring method and pattern measuring device App 20080224035 - Sutani; Takumichi ; et al.	2008-09-18
Pattern Inspection Apparatus and Semiconductor Inspection System App 20080175469 - TOYODA; Yasutaka ; et al.	2008-07-24
Method and apparatus for arranging recipe of scanning electron microscope and apparatus for evaluating shape of semiconductor device pattern Grant 7,365,322 - Miyamoto , et al. April 29, 2	2008-04-29
Pattern matching method and computer program for executing pattern matching App 20080037830 - Sugiyama; Akiyuki ; et al.	2008-02-14
Electron microscope App 20080024601 - Sato; Hidetoshi ; et al.	2008-01-31
System and method for detecting a defect App 20080016481 - Matsuoka; Ryoichi ; et al.	2008-01-17
Pattern matching method and pattern matching program App 20070223803 - Shindo; Hiroyuki ; et al.	2007-09-27
Workpiece size measurement method and apparatus App 20070221842 - Morokuma; Hidetoshi ; et al.	2007-09-27
Pattern matching apparatus and semiconductor inspection system using the same App 20070098248 - Toyoda; Yasutaka ; et al.	2007-05-03
Method and apparatus of pattern inspection and semiconductor inspection system using the same App 20070023653 - Toyoda; Yasutaka ; et al.	2007-02-01
Method and apparatus for arranging recipe of scanning electron microscope and apparatus for evaluating shape of semiconductor device pattern App 20060284081 - Miyamoto; Atsushi ; et al.	2006-12-21
Method and apparatus for measuring dimension of a pattern formed on a semiconductor wafer App 20060288325 - Miyamoto; Atsushi ; et al.	2006-12-21
Photomask having a focus monitor pattern Grant 7,108,945 - Sutani , et al. September 19, 2	2006-09-19
Pattern measuring method and pattern measuring device App 20060193508 - Sutani; Takumichi ; et al.	2006-08-31
Dimension measuring SEM system, method of evaluating shape of circuit pattern and a system for carrying out the method App 20060108524 - Nagatomo; Wataru ; et al.	2006-05-25
Focus monitoring method, exposure apparatus, and exposure mask Grant 6,701,512 - Sutani , et al. March 2, 2	2004-03-02
Photomask having a focus monitor pattern App 20030219655 - Sutani, Takumichi ; et al.	2003-11-27
Focus monitoring method, exposure apparatus, and exposure mask App 20020100012 - Sutani, Takumichi ; et al.	2002-07-25

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