loadpatents
name:-0.0011918544769287
name:-0.015274047851562
name:-0.00067496299743652
Sussman; Myles Patent Filings

Sussman; Myles

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sussman; Myles.The latest application filed is for "classifying queries".

Company Profile
0.13.0
  • Sussman; Myles - San Francisco CA
  • Sussman; Myles - San Mateo CA
  • Sussman; Myles - San Diego CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Classifying queries
Grant 8,918,416 - Gross , et al. December 23, 2
2014-12-23
Advertisement selection
Grant 8,423,405 - Gopalratnam , et al. April 16, 2
2013-04-16
User-based advertisement positioning using markov models
Grant 8,271,328 - Baltz , et al. September 18, 2
2012-09-18
Wafer-level testing of optical and optoelectronic chips
Grant 7,586,608 - Gunn, III , et al. September 8, 2
2009-09-08
Optoelectronic alignment structures for the wafer level testing of optical and optoelectronic chips
Grant 7,412,138 - Malendevich , et al. August 12, 2
2008-08-12
Optical alignment loops for the wafer-level testing of optical and optoelectronic chips
Grant 7,378,861 - Malendevich , et al. May 27, 2
2008-05-27
Optoelectronic alignment structures for the wafer level testing of optical and optoelectronic chips
Grant 7,298,939 - Malendevich , et al. November 20, 2
2007-11-20
Wafer-level testing of optical and optoelectronic chips
Grant 7,262,852 - Gunn, III , et al. August 28, 2
2007-08-28
Optical alignment loops for the wafer-level testing of optical and optoelectronic chips
Grant 7,224,174 - Malendevich , et al. May 29, 2
2007-05-29
Optical probes with spacing sensors for the wafer level testing of optical and optoelectronic chips
Grant 7,183,759 - Malendevich , et al. February 27, 2
2007-02-27
Wafer-level testing of optical and optoelectronic chips
Grant 7,184,626 - Gunn, III , et al. February 27, 2
2007-02-27
Littrow gratings as alignment structures for the wafer level testing of optical and optoelectronic chips
Grant 7,024,066 - Malendevich , et al. April 4, 2
2006-04-04

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