Sunaoshi; Takeshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sunaoshi; Takeshi.The latest application filed is for "charged particle beam apparatus and control method thereof".

Company Profile

2.6.7

Sunaoshi; Takeshi - Tokyo JP
Sunaoshi; Takeshi - Hitachinaka JP
Sunaoshi; Takeshi - Ibaraki JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle beam apparatus and control method thereof Grant 10,784,074 - Sunaoshi , et al. Sept	2020-09-22
Charged particle beam device, electron microscope and sample observation method Grant 10,204,761 - Sunaoshi , et al. Feb	2019-02-12
Charged Particle Beam Apparatus And Control Method Thereof App 20180350554 - SUNAOSHI; Takeshi ; et al.	2018-12-06
Charged Particle Beam Device, Electron Microscope and Sample Observation Method App 20170221676 - SUNAOSHI; Takeshi ; et al.	2017-08-03
Semiconductor testing method and semiconductor tester Grant 8,067,752 - Ando , et al. November 29, 2	2011-11-29
Inspection apparatus having a heating mechanism for performing sample temperature regulation Grant 8,040,146 - Sunaoshi , et al. October 18, 2	2011-10-18
Semiconductor Testing Method and Semiconductor Tester App 20100200749 - ANDO; Tohru ; et al.	2010-08-12
Semiconductor testing method and semiconductor tester Grant 7,732,791 - Ando , et al. June 8, 2	2010-06-08
Inspection Apparatus And Method App 20100123474 - Sunaoshi; Takeshi ; et al.	2010-05-20
Inspection apparatus and method Grant 7,663,390 - Sunaoshi , et al. February 16, 2	2010-02-16
Inspection Apparatus And Method App 20090009203 - SUNAOSHI; Takeshi ; et al.	2009-01-08
Semiconductor Testing Method and Semiconductor Tester App 20080237462 - ANDO; Tohru ; et al.	2008-10-02
Non-oxide ceramic having oxide layer on the surface thereof, method for production thereof and use thereof App 20070161494 - Fukuyama; Hiroyuki ; et al.	2007-07-12

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