| Patent | Date |
|---|
Testing System, Crack Noise Monitoring Device And Method For Monitoring Crack Noise
App 20220293121 - LIAO; Chih-Chieh ; et al. | 2022-09-15 |
Testing Apparatus And Its Element Pickup Module
App 20220291256 - LIAO; Chih-Chieh ; et al. | 2022-09-15 |
Thermal Peak Suppression Device
App 20220270953 - LIAO; Chih-Chieh ; et al. | 2022-08-25 |
Testing Equipment, Its Component Carrying Device And Testing Method Of The Testing Equipment
App 20220178990 - LIAO; Chih-Chieh ; et al. | 2022-06-09 |
Testing equipment, its component carrying device and testing method of the testing equipment
Grant 11,340,288 - Liao , et al. May 24, 2 | 2022-05-24 |
Inspecting Device
App 20220136816 - Liao; Chih-Chieh ; et al. | 2022-05-05 |
Testing Apparatus
App 20220136724 - Liao; Chih-Chieh ; et al. | 2022-05-05 |
Probe card module
Grant 11,156,639 - Liao , et al. October 26, 2 | 2021-10-26 |
Probe Card Module
App 20210223290 - Liao; Chih-Chieh ; et al. | 2021-07-22 |
Testing system for semiconductor package components and its thermal barrier layer element
Grant 10,598,724 - Liao , et al. | 2020-03-24 |
Drying apparatus
Grant 10,566,217 - Liao , et al. Feb | 2020-02-18 |
Testing equipment for semiconductor element and its carrying device
Grant 10,502,775 - Liao , et al. Dec | 2019-12-10 |
Drying Apparatus
App 20190304810 - LIAO; Chih-Chieh ; et al. | 2019-10-03 |
Probe card system, probe loader device and manufacturing method of the probe loader device
Grant 10,274,516 - Liao , et al. | 2019-04-30 |
Testing System For Semiconductor Package Components And Its Thermal Barrier Layer Element
App 20190064258 - LIAO; Chih-Chieh ; et al. | 2019-02-28 |
Testing Equipment For Semiconductor Element And Its Carrying Device
App 20190064247 - LIAO; Chih-Chieh ; et al. | 2019-02-28 |
Electronic device having active heat dissipation
Grant 10,154,612 - Sun , et al. Dec | 2018-12-11 |
Testing apparatus and its probe connector
Grant 10,132,835 - Liao , et al. November 20, 2 | 2018-11-20 |
Probe Card System, Probe Loader Device And Manufacturing Method Of The Probe Loader Device
App 20180321278 - LIAO; Chih-Chieh ; et al. | 2018-11-08 |
Probe card device
Grant 10,048,290 - Liao , et al. August 14, 2 | 2018-08-14 |
Damping component and integrated-circuit testing apparatus using the same
Grant 10,041,817 - Liao , et al. August 7, 2 | 2018-08-07 |
Damping Component And Integrated-circuit Testing Apparatus Using The Same
App 20180087936 - LIAO; Chih-Chieh ; et al. | 2018-03-29 |
Testing Apparatus And Its Probe Connector
App 20180038892 - LIAO; Chih-Chieh ; et al. | 2018-02-08 |
Probe Card Device
App 20170269126 - LIAO; Chih-Chieh ; et al. | 2017-09-21 |
Probe card
Grant 9,678,110 - Liao , et al. June 13, 2 | 2017-06-13 |
Testing Unit And Testing Apparatus Using The Same
App 20170052218 - LIAO; Chih-Chieh ; et al. | 2017-02-23 |
Circuit Probing System And Its Circuit Probing Device
App 20170045554 - LIAO; Chih-Chieh ; et al. | 2017-02-16 |
Probe Card
App 20170010305 - LIAO; Chih-Chieh ; et al. | 2017-01-12 |
Burn-in socket and testing fixture using the same
Grant 8,487,642 - Sun , et al. July 16, 2 | 2013-07-16 |
Burn-in socket and testing fixture using the same
App 20120025860 - Sun; Yu-Min ; et al. | 2012-02-02 |
Bootstrap circuit and bulk circuit thereof
Grant 8,026,705 - Chen , et al. September 27, 2 | 2011-09-27 |
Bootstrap circuit and bulk circuit thereof
App 20100117610 - Chen; Li-Chieh ; et al. | 2010-05-13 |
Switch control circuit with voltage sensing function and camera flash capacitor charger thereof
App 20100109613 - Chuang; Yung-Chun ; et al. | 2010-05-06 |
Bandgap Voltage Reference Circuit
App 20100102795 - Sun; Yu-Min ; et al. | 2010-04-29 |
Floating protection circuit and photo-flash capacitor charger thereof
App 20100103575 - Chuang; Yung-Chun ; et al. | 2010-04-29 |
Clamp Circuit And Combinational Circuit Thereof
App 20090174373 - CHENG; LI SHENG ; et al. | 2009-07-09 |
Circuit for fixing peak current of an inductor and method thereof
Grant 7,551,008 - Chien , et al. June 23, 2 | 2009-06-23 |
Oscillation circuit having current scaling relationship and the method for using the same
Grant 7,501,908 - Chien , et al. March 10, 2 | 2009-03-10 |
Power transistor circuit and the method thereof
Grant 7,495,499 - Chung , et al. February 24, 2 | 2009-02-24 |
Circuit for detecting maximal frequency of pulse frequency modulation and method thereof
Grant 7,471,117 - Chen , et al. December 30, 2 | 2008-12-30 |
Circuit for starting up a synchronous step-up DC/DC converter and the method thereof
Grant 7,456,622 - Chien , et al. November 25, 2 | 2008-11-25 |
Circuit and method for switching PFM and PWM
Grant 7,446,621 - Chen , et al. November 4, 2 | 2008-11-04 |
Circuit for fixing peak current of an inductor and method thereof
App 20080231348 - Chien; Mao Chuan ; et al. | 2008-09-25 |
Oscillation circuit and the method for using the same
App 20080231386 - Chien; Mao Chuan ; et al. | 2008-09-25 |
Circuit for starting up a synchronous step-up DC/DC converter and the method thereof
App 20080224673 - Chien; Mao Chuan ; et al. | 2008-09-18 |
Circuit and method for switching PFM and PWM
App 20080218284 - Chen; Li Chieh ; et al. | 2008-09-11 |
Power transistor circuit and the method thereof
App 20080205099 - Chung; Chien Chuan ; et al. | 2008-08-28 |
Circuit for detecting maximal frequency of pulse frequency modulation and method thereof
App 20080197885 - Chen; Li Chieh ; et al. | 2008-08-21 |
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