Sullivan; Jamie M.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sullivan; Jamie M..The latest application filed is for "multi-spot scanning collection optics".

Company Profile

0.12.11

Sullivan; Jamie M. - Eugene OR
Sullivan; Jamie M. - Sunnyvale CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Multi-spot scanning collection optics Grant 9,970,883 - Sullivan , et al. May 15, 2	2018-05-15
System and method for oblique incidence scanning with 2D array of spots Grant 9,891,175 - Sullivan , et al. February 13, 2	2018-02-13
Systems and methods for run-time alignment of a spot scanning wafer inspection system Grant 9,864,173 - Sullivan , et al. January 9, 2	2018-01-09
System and method for apodization in a semiconductor device inspection system Grant 9,645,093 - Sullivan , et al. May 9, 2	2017-05-09
Multi-spot Scanning Collection Optics App 20170115232 - Sullivan; Jamie M. ; et al.	2017-04-27
Multi-spot scanning collection optics Grant 9,546,962 - Sullivan , et al. January 17, 2	2017-01-17
System and Method for Oblique Incidence Scanning with 2D Array of Spots App 20160327493 - Sullivan; Jamie M. ; et al.	2016-11-10
Systems and Methods for Run-Time Alignment of a Spot Scanning Wafer Inspection System App 20160313256 - Sullivan; Jamie M. ; et al.	2016-10-27
Enhanced high-speed logarithmic photo-detector for spot scanning system Grant 9,389,166 - Wolf , et al. July 12, 2	2016-07-12
System and Method for Apodization in a Semiconductor Device Inspection System App 20160054232 - Sullivan; Jamie M. ; et al.	2016-02-25
Image synchronization of scanning wafer inspection system Grant 9,208,553 - Cao , et al. December 8, 2	2015-12-08
System and method for apodization in a semiconductor device inspection system Grant 9,176,069 - Sullivan , et al. November 3, 2	2015-11-03
Multi-spot Scanning Collection Optics App 20150226677 - Sullivan; Jamie M. ; et al.	2015-08-13
Image Synchronization Of Scanning Wafer Inspection System App 20150170357 - Cao; Kai ; et al.	2015-06-18
Image synchronization of scanning wafer inspection system Grant 8,995,746 - Cao , et al. March 31, 2	2015-03-31
Image Synchronization Of Scanning Wafer Inspection System App 20140270471 - Cao; Kai ; et al.	2014-09-18
System and Method for Apodization in a Semiconductor Device Inspection System App 20140016125 - Sullivan; Jamie M. ; et al.	2014-01-16
Enhanced High-speed Logarithmic Photo-detector For Spot Scanning System App 20130169957 - Wolf; Ralph C. ; et al.	2013-07-04
Apparatus and methods for optically inspecting a sample for anomalies Grant 7,012,683 - Wolf , et al. March 14, 2	2006-03-14
Apparatus and methods for optically inspecting a sample for anomalies App 20050092899 - Wolf, Ralph C. ; et al.	2005-05-05
Apparatus and methods for optically inspecting a sample for anomalies Grant 6,833,913 - Wolf , et al. December 21, 2	2004-12-21
UV compatible programmable spatial filter Grant 6,686,994 - Wilk , et al. February 3, 2	2004-02-03
UV compatible programmable spatial filter App 20030184739 - Wilk, Dieter E. ; et al.	2003-10-02

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