SULLIVAN; Jamie

Patent Applications and Registrations

Patent applications and USPTO patent grants for SULLIVAN; Jamie.The latest application filed is for "methods and systems for analyte detection and analysis".

Company Profile

6.8.7

SULLIVAN; Jamie - Eugene OR
Sullivan; Jamie - Sunnyvale CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods And Systems For Analyte Detection And Analysis App 20200326327 - BARBEE; Kristopher ; et al.	2020-10-15
Methods for biological sample processing and analysis Grant 10,344,328 - Barbee , et al. July 9, 2	2019-07-09
Methods And Systems For Analyte Detection And Analysis App 20190153520 - BARBEE; Kristopher ; et al.	2019-05-23
Methods For Biological Sample Processing And Analysis App 20190153531 - BARBEE; Kristopher ; et al.	2019-05-23
Methods and systems for analyte detection and analysis Grant 10,273,528 - Barbee , et al.	2019-04-30
Systems for biological sample processing and analysis Grant 10,267,790 - Barbee , et al.	2019-04-23
Interleaved acousto-optical device scanning for suppression of optical crosstalk Grant 10,060,884 - Sullivan , et al. August 28, 2	2018-08-28
Interleaved Acousto-Optical Device Scanning For Suppression Of Optical Crosstalk App 20160290971 - Sullivan; Jamie ; et al.	2016-10-06
Interleaved acousto-optical device scanning for suppression of optical crosstalk Grant 9,395,340 - Sullivan , et al. July 19, 2	2016-07-19
Interleaved Acousto-Optical Device Scanning For Suppression Of Optical Crosstalk App 20140260640 - Sullivan; Jamie ; et al.	2014-09-18
Systems configured to inspect a specimen Grant 7,535,563 - Chen , et al. May 19, 2	2009-05-19
Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection Grant 6,922,236 - Vaez-Iravani , et al. July 26, 2	2005-07-26
Systems and methods for scanning a beam of light across a specimen Grant 6,775,051 - Sullivan , et al. August 10, 2	2004-08-10
Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection App 20030011760 - Vaez-Iravani, Mehdi ; et al.	2003-01-16
Systems and methods for scanning a beam of light across a specimen App 20020181119 - Sullivan, Jamie ; et al.	2002-12-05

Company Registrations

DUNS

117640965

Sullivan, Jamie

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