Suh; Ui Won

Patent Applications and Registrations

Patent applications and USPTO patent grants for Suh; Ui Won.The latest application filed is for "system and method for inspection of parts with complex geometries".

Company Profile

0.12.14

Suh; Ui Won - Cincinnati OH
Suh; Ui Won - Cincinnatti OH

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for eddy current inspection of parts with complex geometries Grant 8,269,489 - Wang , et al. September 18, 2	2012-09-18
Methods and apparatus for testing a component Grant 8,013,599 - Suh , et al. September 6, 2	2011-09-06
Omnidirectional eddy current array probes and methods of use Grant 7,948,233 - Sheila-Vadde , et al. May 24, 2	2011-05-24
Multi-frequency image processing for inspecting parts having complex geometric shapes Grant 7,817,845 - Suh , et al. October 19, 2	2010-10-19
System And Method For Inspection Of Parts With Complex Geometries App 20100127699 - Wang; Changting ; et al.	2010-05-27
Omnidirectional Eddy Current Array Probes and Methods of Use App 20100085045 - Sheila-Vadde; Aparna Chakrapani ; et al.	2010-04-08
Methods and apparatus for testing a component Grant 7,689,030 - Suh , et al. March 30, 2	2010-03-30
Methods and apparatus for testing a component Grant 7,436,992 - Suh , et al. October 14, 2	2008-10-14
Multi-frequency Image Processing For Inspecting Parts Having Complex Geometric Shapes App 20080159619 - SUH; Ui Won ; et al.	2008-07-03
Method for performing model based scanplan generation of a component under inspection Grant 7,337,651 - Shankarappa , et al. March 4, 2	2008-03-04
Method Of Aligning Probe For Eddy Current Inspection App 20070244659 - Suh; Ui Won ; et al.	2007-10-18
Methods and apparatus for testing a component App 20070140546 - Suh; Ui Won ; et al.	2007-06-21
Eddy current probe and inspection method Grant 7,154,265 - Togo , et al. December 26, 2	2006-12-26
Method for performing model based scanplan generation of a component under inspection App 20060224348 - Shankarappa; Suneel Tumkur ; et al.	2006-10-05
Eddy current probe and inspection method App 20060132124 - Togo; Mottito ; et al.	2006-06-22
Methods and apparatus for testing a component App 20060109001 - Suh; Ui Won ; et al.	2006-05-25
Methods and apparatus for testing a component App 20060023961 - Suh; Ui Won ; et al.	2006-02-02
Real time laser shock peening quality assurance by natural frequency analysis Grant 6,914,215 - Davis , et al. July 5, 2	2005-07-05
Eddy current inspection method Grant 6,907,358 - Suh , et al. June 14, 2	2005-06-14
Real time laser shock peening quality assurance by natural frequency analysis App 20040262276 - Davis, Brian Michael ; et al.	2004-12-30
Eddy Current Inspection Method App 20040153260 - Suh, Ui Won ; et al.	2004-08-05
Laser shock peening quality assurance by acoustic analysis Grant 6,629,464 - Suh , et al. October 7, 2	2003-10-07
Laser shock peening quality assurance by acoustic analysis App 20030062349 - Suh, Ui Won ; et al.	2003-04-03
Simultaneous offset dual sided laser shock peening using low energy laser beams App 20030042234 - Suh, Ui Won ; et al.	2003-03-06
Simultaneous offset dual sided laser shock peening with oblique angle laser beams App 20030042235 - Suh, Ui Won ; et al.	2003-03-06
Laser shock peening quality assurance by ultrasonic analysis Grant 6,422,082 - Suh July 23, 2	2002-07-23

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