Patent | Date |
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System and method for eddy current inspection of parts with complex geometries Grant 8,269,489 - Wang , et al. September 18, 2 | 2012-09-18 |
Methods and apparatus for testing a component Grant 8,013,599 - Suh , et al. September 6, 2 | 2011-09-06 |
Omnidirectional eddy current array probes and methods of use Grant 7,948,233 - Sheila-Vadde , et al. May 24, 2 | 2011-05-24 |
Multi-frequency image processing for inspecting parts having complex geometric shapes Grant 7,817,845 - Suh , et al. October 19, 2 | 2010-10-19 |
System And Method For Inspection Of Parts With Complex Geometries App 20100127699 - Wang; Changting ;   et al. | 2010-05-27 |
Omnidirectional Eddy Current Array Probes and Methods of Use App 20100085045 - Sheila-Vadde; Aparna Chakrapani ;   et al. | 2010-04-08 |
Methods and apparatus for testing a component Grant 7,689,030 - Suh , et al. March 30, 2 | 2010-03-30 |
Methods and apparatus for testing a component Grant 7,436,992 - Suh , et al. October 14, 2 | 2008-10-14 |
Multi-frequency Image Processing For Inspecting Parts Having Complex Geometric Shapes App 20080159619 - SUH; Ui Won ;   et al. | 2008-07-03 |
Method for performing model based scanplan generation of a component under inspection Grant 7,337,651 - Shankarappa , et al. March 4, 2 | 2008-03-04 |
Method Of Aligning Probe For Eddy Current Inspection App 20070244659 - Suh; Ui Won ;   et al. | 2007-10-18 |
Methods and apparatus for testing a component App 20070140546 - Suh; Ui Won ;   et al. | 2007-06-21 |
Eddy current probe and inspection method Grant 7,154,265 - Togo , et al. December 26, 2 | 2006-12-26 |
Method for performing model based scanplan generation of a component under inspection App 20060224348 - Shankarappa; Suneel Tumkur ;   et al. | 2006-10-05 |
Eddy current probe and inspection method App 20060132124 - Togo; Mottito ;   et al. | 2006-06-22 |
Methods and apparatus for testing a component App 20060109001 - Suh; Ui Won ;   et al. | 2006-05-25 |
Methods and apparatus for testing a component App 20060023961 - Suh; Ui Won ;   et al. | 2006-02-02 |
Real time laser shock peening quality assurance by natural frequency analysis Grant 6,914,215 - Davis , et al. July 5, 2 | 2005-07-05 |
Eddy current inspection method Grant 6,907,358 - Suh , et al. June 14, 2 | 2005-06-14 |
Real time laser shock peening quality assurance by natural frequency analysis App 20040262276 - Davis, Brian Michael ;   et al. | 2004-12-30 |
Eddy Current Inspection Method App 20040153260 - Suh, Ui Won ;   et al. | 2004-08-05 |
Laser shock peening quality assurance by acoustic analysis Grant 6,629,464 - Suh , et al. October 7, 2 | 2003-10-07 |
Laser shock peening quality assurance by acoustic analysis App 20030062349 - Suh, Ui Won ;   et al. | 2003-04-03 |
Simultaneous offset dual sided laser shock peening with oblique angle laser beams App 20030042235 - Suh, Ui Won ;   et al. | 2003-03-06 |
Simultaneous offset dual sided laser shock peening using low energy laser beams App 20030042234 - Suh, Ui Won ;   et al. | 2003-03-06 |
Laser shock peening quality assurance by ultrasonic analysis Grant 6,422,082 - Suh July 23, 2 | 2002-07-23 |