Sugihara; Mari

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sugihara; Mari.The latest application filed is for "image processing device and computer-readable computer program product containing image processing program".

Company Profile

0.7.8

Sugihara; Mari - Tokyo N/A JP
Sugihara; Mari - Shinagawa-ku N/A JP
Sugihara, Mari - Setagaya-ku JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Image processing device and computer-readable computer program product containing image processing program Grant 8,928,768 - Sugihara January 6, 2	2015-01-06
Defect inspection apparatus, defect inspection method and method of inspecting hole pattern Grant 8,446,578 - Sugihara , et al. May 21, 2	2013-05-21
Camera and image processing program Grant 8,199,242 - Sugihara June 12, 2	2012-06-12
Recording medium storing image processing program and image processing method Grant 8,041,148 - Sugihara October 18, 2	2011-10-18
Image Processing Device And Computer-readable Computer Program Product Containing Image Processing Program App 20110234818 - SUGIHARA; Mari	2011-09-29
Image processing apparatus and medium storing image processing program App 20100260438 - MORIKAWA; Takatoshi ; et al.	2010-10-14
Defect inspection apparatus, defect inspection method and method of inspecting hole pattern App 20100103419 - Sugihara; Mari ; et al.	2010-04-29
Defect inspection apparatus, defect inspection method and method of inspecting hole pattern Grant 7,643,137 - Sugihara , et al. January 5, 2	2010-01-05
Camera and Image Processing Program App 20090185046 - Sugihara; Mari	2009-07-23
Recording medium storing image processing program and image processing method App 20080219591 - Sugihara; Mari	2008-09-11
Defect inspection apparatus, defect inspection method and method of inspecting hole pattern App 20060232769 - Sugihara; Mari ; et al.	2006-10-19
Imaging device having image color adjustment function App 20060055784 - Sugihara; Mari ; et al.	2006-03-16
Defect inspection apparatus, defect inspection method and method of inspecting hole pattern App 20040239918 - Sugihara, Mari ; et al.	2004-12-02

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