Sugaya; Masakazu
Patent Applications and Registrations
Patent applications and USPTO patent grants for Sugaya; Masakazu.The latest application filed is for "size distribution measurement device, size distribution measurement method, and sample container".
Company Profile
6.24.30
- Sugaya; Masakazu - Tokyo JP
- Sugaya; Masakazu - Inagi JP
- Sugaya; Masakazu - Kawasaki JP
- Sugaya, Masakazu - Kawasaki-shi JP
Patent Activity
| Patent | Date |
|---|---|
| Cancer test system and method for assessing cancer test Grant 11,443,851 - Sakairi , et al. September 13, 2 | 2022-09-13 |
| Size Distribution Measurement Device, Size Distribution Measurement Method, And Sample Container App 20220065766 - Anzai; Yumiko ; et al. | 2022-03-03 |
| Cancer analysis system and cancer analysis method Grant 11,249,069 - Sakairi , et al. February 15, 2 | 2022-02-15 |
| Mirror Electronic Inspection Device App 20210313138 - YAMAOKA; Masahiro ; et al. | 2021-10-07 |
| Ultrasonic CT device Grant 10,945,684 - Tsubota , et al. March 16, 2 | 2021-03-16 |
| Ultrasonic Ct Device App 20190290223 - TSUBOTA; Yushi ; et al. | 2019-09-26 |
| Liquid feeding device and cell culture device Grant 10,329,525 - Kiyama , et al. | 2019-06-25 |
| Cancer Analysis System And Cancer Analysis Method App 20190079071 - SAKAIRI; Minoru ; et al. | 2019-03-14 |
| Liquid delivery device and cell culture device using same Grant 10,184,100 - Kiyama , et al. Ja | 2019-01-22 |
| Charged particle beam apparatus and sample elevating apparatus Grant 10,153,128 - Sugaya , et al. Dec | 2018-12-11 |
| Cell culture device Grant 10,138,450 - Nozaki , et al. Nov | 2018-11-27 |
| Cancer Test System and Method for Assessing Cancer Test App 20180313839 - SAKAIRI; Minoru ; et al. | 2018-11-01 |
| Cell culturing device, culturing vessel, and holding vessel Grant 10,087,410 - Nozaki , et al. October 2, 2 | 2018-10-02 |
| Substance-testing apparatus, substance-testing system, and substance-testing method Grant 10,048,172 - Sugaya , et al. August 14, 2 | 2018-08-14 |
| Charged Particle Beam Apparatus And Sample Elevating Apparatus App 20180138009 - SUGAYA; Masakazu ; et al. | 2018-05-17 |
| Microparticle detection device and security gate Grant 9,850,696 - Sugaya , et al. December 26, 2 | 2017-12-26 |
| Closed-system Culture Vessel, Transport Method, And Automated Culturing Device App 20170342365 - NOZAKI; Takayuki ; et al. | 2017-11-30 |
| Liquid Feeding Device And Cell Culture Device App 20170198249 - KIYAMA; Masaharu ; et al. | 2017-07-13 |
| Attached matter testing device and testing method Grant 9,696,288 - Kashima , et al. July 4, 2 | 2017-07-04 |
| Cell Culturing Device And Closed-system Culture Vessel App 20170145365 - NOZAKI; Takayuki ; et al. | 2017-05-25 |
| Substance-Testing Apparatus, Substance-Testing System, and Substance-Testing Method App 20170102296 - SUGAYA; Masakazu ; et al. | 2017-04-13 |
| Automated Culture Device App 20160244713 - Nakamura; Taku ; et al. | 2016-08-25 |
| Particle analyzing device Grant 9,423,388 - Terada , et al. August 23, 2 | 2016-08-23 |
| Analyzer for substance Grant 9,417,163 - Nagano , et al. August 16, 2 | 2016-08-16 |
| Liquid Delivery Device And Cell Culture Device Using Same App 20160108350 - KIYAMA; Masaharu ; et al. | 2016-04-21 |
| Attached matter inspection device Grant 9,261,437 - Kashima , et al. February 16, 2 | 2016-02-16 |
| Cell Culturing Device, Culturing Vessel, And Holding Vessel App 20160017271 - NOZAKI; Takayuki ; et al. | 2016-01-21 |
| Cell Culture Device App 20160002584 - NOZAKI; Takayuki ; et al. | 2016-01-07 |
| Particle Analyzing Device App 20150377851 - TERADA; Koichi ; et al. | 2015-12-31 |
| Analysis device and analysis method Grant 9,214,324 - Nagano , et al. December 15, 2 | 2015-12-15 |
| Analysis Device And Analysis Method App 20150235831 - Nagano; Hisashi ; et al. | 2015-08-20 |
| Attached Matter Inspection Device App 20150233796 - Kashima; Hideo ; et al. | 2015-08-20 |
| Analysis device and analysis method Grant 9,040,905 - Nagano , et al. May 26, 2 | 2015-05-26 |
| Microparticle Detection Device and Security Gate App 20150136975 - Sugaya; Masakazu ; et al. | 2015-05-21 |
| Direction Of Motion Conversion Mechanism, Actuator Device Using The Same, And Reagent Manufacturing Apparatus App 20150068627 - HARADA; Kunio ; et al. | 2015-03-12 |
| Analyzer For Substance App 20140260542 - NAGANO; Hisashi ; et al. | 2014-09-18 |
| Attached Matter Testing Device And Testing Method App 20140238106 - Kashima; Hideo ; et al. | 2014-08-28 |
| Analysis Device And Analysis Method App 20140151543 - Nagano; Hisashi ; et al. | 2014-06-05 |
| Detector And Entry Control System App 20120139736 - Suzuki; Yasutaka ; et al. | 2012-06-07 |
| Charged particle beam application system Grant 7,408,760 - Tanimoto , et al. August 5, 2 | 2008-08-05 |
| Mechanism for sealing Grant 7,341,393 - Hosoda , et al. March 11, 2 | 2008-03-11 |
| Charged particle beam application system App 20060056131 - Tanimoto; Sayaka ; et al. | 2006-03-16 |
| Mechanism for sealing App 20060006342 - Hosoda; Masaki ; et al. | 2006-01-12 |
| Laser interferometer displacement measuring system, exposure apparatus, and electron beam lithography apparatus Grant 6,839,142 - Isshiki , et al. January 4, 2 | 2005-01-04 |
| Beam as well as method and equipment for specimen fabrication Grant 6,717,156 - Sugaya , et al. April 6, 2 | 2004-04-06 |
| Laser interferometer displacement measuring system, exposure apparatus, and electron beam lithography apparatus App 20040057055 - Isshiki, Fumio ; et al. | 2004-03-25 |
| Laser interferometer displacement measuring system, exposure apparatus, and electron beam lithography apparatus Grant 6,687,013 - Isshiki , et al. February 3, 2 | 2004-02-03 |
| Substrate temperature control system and method for controlling temperature of substrate Grant 6,518,548 - Sugaya , et al. February 11, 2 | 2003-02-11 |
| Beam as well as method and equipment for specimen fabrication App 20020166976 - Sugaya, Masakazu ; et al. | 2002-11-14 |
| Substrate temperature control system and method for controlling temperature of substrate App 20020113056 - Sugaya, Masakazu ; et al. | 2002-08-22 |
| Substrate temperature control system and method for controlling temperature of substrate Grant 6,394,797 - Sugaya , et al. May 28, 2 | 2002-05-28 |
| Laser interferometer displacement measuring system, exposure apparatus, and elecron beam lithography apparatus App 20020048026 - Isshiki, Fumio ; et al. | 2002-04-25 |
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