Sugamoto; Junji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sugamoto; Junji.The latest application filed is for "method and system for managing semiconductor manufacturing device".

Company Profile

0.12.14

Sugamoto; Junji - Oita JP
Sugamoto; Junji - Yokosuka JP
Sugamoto; Junji - Yokohama JP
Sugamoto; Junji - Yokosuka-shi JP
Sugamoto; Junji - Oita-shi JP
Sugamoto; Junji - Kanagawa JP
Sugamoto; Junji - Yokohama-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and system for managing semiconductor manufacturing device App 20110245956 - Matsushita; Hiroshi ; et al.	2011-10-06
Method and system for managing semiconductor manufacturing device Grant 7,979,154 - Matsushita , et al. July 12, 2	2011-07-12
Method for controlling semiconductor manufacturing apparatus and control system of semiconductor manufacturing apparatus Grant 7,970,486 - Matsushita , et al. June 28, 2	2011-06-28
Process control system, process control method, and method of manufacturing electronic apparatus Grant 7,831,330 - Sugamoto , et al. November 9, 2	2010-11-09
Management system of semiconductor fabrication apparatus, abnormality factor extraction method of semiconductor fabrication apparatus, and management method of the same Grant 7,742,834 - Matsushita , et al. June 22, 2	2010-06-22
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them Grant 7,700,381 - Arikado , et al. April 20, 2	2010-04-20
Process control system, process control method, and method of manufacturing electronic apparatus App 20090276078 - Sugamoto; Junji ; et al.	2009-11-05
Process control system, process control method, and method of manufacturing electronic apparatus Grant 7,596,421 - Sugamoto , et al. September 29, 2	2009-09-29
Method of inspecting semiconductor wafer Grant 7,531,462 - Tanzawa , et al. May 12, 2	2009-05-12
Defect detection system, defect detection method, and defect detection program Grant 7,529,631 - Matsushita , et al. May 5, 2	2009-05-05
Method And System For Managing Semiconductor Manufacturing Device App 20080147226 - MATSUSHITA; Hiroshi ; et al.	2008-06-19
Process-state management system, management server and control server adapted for the system, method for managing process-states, method for manufacturing a product, and computer program product for the management server Grant 7,324,855 - Ushiku , et al. January 29, 2	2008-01-29
Defect detection system, defect detection method, and defect detection program App 20080004823 - Matsushita; Hiroshi ; et al.	2008-01-03
Semiconductor wafer treatment method, semiconductor wafer inspection method, semiconductor device development method and semiconductor wafer treatment apparatus Grant 7,314,766 - Sugamoto , et al. January 1, 2	2008-01-01
Management system of semiconductor fabrication apparatus, abnormality factor extraction method of semiconductor fabrication apparatus, and management method of the same App 20070276528 - Matsushita; Hiroshi ; et al.	2007-11-29
Method and system for manufacturing a semiconductor device App 20070254482 - Kawabata; Kenji ; et al.	2007-11-01
Method for controlling semiconductor manufacturing apparatus and control system of semiconductor manufacturing apparatus App 20070225853 - Matsushita; Hiroshi ; et al.	2007-09-27
System and method for monitoring manufacturing apparatuses Grant 7,221,991 - Matsushita , et al. May 22, 2	2007-05-22
Process control system, process control method, and method of manufacturing electronic apparatus App 20060287754 - Sugamoto; Junji ; et al.	2006-12-21
Method of inspecting semiconductor wafer App 20060281281 - Tanzawa; Katsujiro ; et al.	2006-12-14
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them App 20060131696 - Arikado; Tsunetoshi ; et al.	2006-06-22
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them Grant 7,057,259 - Arikado , et al. June 6, 2	2006-06-06
Process-state management system, management server and control server adapted for the system, method for managing process-states, method for manufacturing a product, and computer program product for the management server App 20060064188 - Ushiku; Yukihiro ; et al.	2006-03-23
System and method for controlling manufacturing apparatuses App 20050194590 - Matsushita, Hiroshi ; et al.	2005-09-08
Semiconductor wafer treatment method, semiconductor wafer inspection method, semiconductor device development method and semiconductor wafer treatment apparatus App 20040137752 - Sugamoto, Junji ; et al.	2004-07-15
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them App 20030003608 - Arikado, Tsunetoshi ; et al.	2003-01-02

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.