Sugamori; Shigeru
Patent Applications and Registrations
Patent applications and USPTO patent grants for Sugamori; Shigeru.The latest application filed is for "test method, test system and assist board".
- Sugamori; Shigeru - Tokyo JP
- Sugamori; Shigeru - Santa Clara CA
- Sugamori, Shigeru - Ora-gun JP
- Sugamori; Shigeru - Gyoda JP
| Patent | Date |
|---|---|
| Test method, test system and assist board Grant 7,596,730 - Watanabe , et al. September 29, 2 | 2009-09-29 |
| Test method, test system and assist board App 20070234146 - Watanabe; Yuya ; et al. | 2007-10-04 |
| Test system, added apparatus, and test method Grant 7,209,849 - Watanabe , et al. April 24, 2 | 2007-04-24 |
| Event based IC test system Grant 7,089,135 - Rajsuman , et al. August 8, 2 | 2006-08-08 |
| Event based semiconductor test system Grant 6,678,643 - Turnquist , et al. January 13, 2 | 2004-01-13 |
| Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory Grant 6,668,331 - Gomes , et al. December 23, 2 | 2003-12-23 |
| Event based IC test system App 20030217345 - Rajsuman, Rochit ; et al. | 2003-11-20 |
| Modular architecture for memory testing on event based test system Grant 6,651,204 - Rajsuman , et al. November 18, 2 | 2003-11-18 |
| Application specific event based semiconductor memory test system Grant 6,631,340 - Sugamori , et al. October 7, 2 | 2003-10-07 |
| Module based flexible semiconductor test system Grant 6,629,282 - Sugamori , et al. September 30, 2 | 2003-09-30 |
| Semiconductor test system storing pin calibration data in non-volatile memory App 20030110427 - Rajsuman, Rochit ; et al. | 2003-06-12 |
| Event based test system storing pin calibration data in non-volatile memory Grant 6,567,941 - Turnquist , et al. May 20, 2 | 2003-05-20 |
| Application specific event based semiconductor memory test system App 20030074153 - Sugamori, Shigeru ; et al. | 2003-04-17 |
| Event based semiconductor test system Grant 6,532,561 - Turnquist , et al. March 11, 2 | 2003-03-11 |
| Power source current measurement unit for semiconductor test system App 20020070726 - Sugamori, Shigeru | 2002-06-13 |
| Multiple end of test signal for event based test system Grant 6,404,218 - Le , et al. June 11, 2 | 2002-06-11 |
| Application specific event based semiconductor test system Grant 6,331,770 - Sugamori December 18, 2 | 2001-12-18 |
| Application specific event based semiconductor memory test system Grant 6,314,034 - Sugamori November 6, 2 | 2001-11-06 |
| IC Tester Grant 4,497,056 - Sugamori January 29, 1 | 1985-01-29 |
| Semiconductor memory device test apparatus Grant 4,414,665 - Kimura , et al. November 8, 1 | 1983-11-08 |
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