SUGA; Mitsuo

Patent Applications and Registrations

Patent applications and USPTO patent grants for SUGA; Mitsuo.The latest application filed is for "biological tissue image processing system, and machine learning method".

Company Profile

1.6.10

SUGA; Mitsuo - Akishima-shi JP
Suga; Mitsuo - Tokyo JP
Suga; Mitsuo - Saitama JP
Suga; Mitsuo - Koshigaya JP
Suga; Mitsuo - Saitama-ken JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Biological Tissue Image Processing System, And Machine Learning Method App 20210073992 - KONISHI; Kohki ; et al.	2021-03-11
Sample Holder, Inspection Apparatus, and Inspection Method App 20110284745 - Nishiyama; Hidetoshi ; et al.	2011-11-24
Specimen holder, specimen inspection apparatus, and specimen inspection method Grant 8,030,622 - Nishiyama , et al. October 4, 2	2011-10-04
Sample holder, method for observation and inspection, and apparatus for observation and inspection Grant 7,928,380 - Suga , et al. April 19, 2	2011-04-19
Inspection method and reagent solution Grant 7,906,760 - Nishiyama , et al. March 15, 2	2011-03-15
Method of inspecting pattern and inspecting instrument Grant 7,876,113 - Nozoe , et al. January 25, 2	2011-01-25
Apparatus and Method for Inspecting Samples App 20100243888 - Nishiyama; Hidetoshi ; et al.	2010-09-30
Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspection Method App 20100019146 - Nishiyama; Hidetoshi ; et al.	2010-01-28
Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspection Method App 20090314955 - Nishiyama; Hidetoshi ; et al.	2009-12-24
Inspection Method and Reagent Solution App 20090250609 - Nishiyama; Hidetoshi ; et al.	2009-10-08
Sample Holder, Method for Observation and Inspection, and Apparatus for Observation and Inspection App 20090166536 - Suga; Mitsuo ; et al.	2009-07-02
Charged-particle beam instrument Grant 7,202,476 - Suga , et al. April 10, 2	2007-04-10
Charged-particle beam instrument App 20060219914 - Suga; Mitsuo ; et al.	2006-10-05
Method of inspecting pattern and inspecting instrument Grant 6,924,482 - Nozoe , et al. August 2, 2	2005-08-02
Method of inspecting pattern and inspecting instrument App 20030179007 - Nozoe, Mari ; et al.	2003-09-25
Method of inspecting pattern and inspecting instrument App 20010052781 - Nozoe, Mari ; et al.	2001-12-20

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